R. G. Bennetts
List of publications from the DBLP Bibliography Server - FAQ
| 2007 | ||
|---|---|---|
| 15 | EE | Ben Bennetts: Electronics Design-for-Test: Past, Present and Future. European Test Symposium 2007: 4 |
| 2006 | ||
| 14 | EE | Bill Eklow, Ben Bennetts: New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). European Test Symposium 2006: 253-254 |
| 2004 | ||
| 13 | EE | Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191 |
| 2003 | ||
| 12 | EE | Monica Lobetti Bodoni, Ben Bennetts: Guest Editors' Introduction: Board Test. IEEE Design & Test of Computers 20(2): 5-7 (2003) |
| 11 | EE | Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts: Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. IEEE Design & Test of Computers 20(2): 8-18 (2003) |
| 1999 | ||
| 10 | Tony Ambler, Ben Bennetts: Guest Editors' Introduction: Test and the Product Life Cycle. IEEE Design & Test of Computers 16(3): 20-22 (1999) | |
| 9 | EE | Mike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999) |
| 1996 | ||
| 8 | Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie: Built-In Self-Test: Assuring System Integrity. IEEE Computer 29(11): 39-45 (1996) | |
| 1995 | ||
| 7 | Ben Bennetts: Guest Editor's Introduction. IEEE Design & Test of Computers 12(2): 6-7 (1995) | |
| 1992 | ||
| 6 | Ben Bennetts: Progress in DFT: A Personal View. ITC 1992: 19-20 | |
| 5 | Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241 | |
| 1991 | ||
| 4 | R. G. Bennetts: Scan Technology at Work. Fault-Tolerant Computing Systems 1991: 124-135 | |
| 1990 | ||
| 3 | Ben Bennetts: Test Technology in Europe. IEEE Design & Test of Computers 7(1): 6-8 (1990) | |
| 1972 | ||
| 2 | EE | R. G. Bennetts: A realistic approach to detection test generation for combinatorial logic circuits. Comput. J. 15(3): 238-246 (1972) |
| 1971 | ||
| 1 | Ben Bennetts, D. W. Lewin: Fault Diagnosis of Digital Systems - A Review. Comput. J. 14(2): 199-206 (1971) | |
| 1 | Tony Ambler | [10] |
| 2 | Carl Barnhart | [13] |
| 3 | Frans P. M. Beenker | [5] |
| 4 | Monica Lobetti Bodoni | [12] |
| 5 | Dave Bonnett | [13] |
| 6 | Frank Bouwman | [5] |
| 7 | Adam Cron | [13] |
| 8 | Bill Eklow (William Eklow) | [13] [14] |
| 9 | Henk D. L. Hollmann | [11] |
| 10 | Neil Jacobson | [13] |
| 11 | Najmi T. Jarwala | [8] |
| 12 | Bernd Könemann | [8] |
| 13 | D. W. Lewin | [1] |
| 14 | Adam W. Ley | [9] |
| 15 | Erik Jan Marinissen | [11] |
| 16 | Benoit Nadeau-Dostie | [8] |
| 17 | Steven Oostdijk | [5] |
| 18 | Adam Osseiran | [13] |
| 19 | Rudi Stans | [5] |
| 20 | Stephen K. Sunter | [13] |
| 21 | Bart Vermeulen | [11] |
| 22 | Mike Wondolowski | [9] |