| 1995 | ||
|---|---|---|
| 6 | Geetani Edirisooriya, Samantha Edirisooriya: Scan Chain Fault Diagnosis with Fault Dictionaries. ISCAS 1995: 1912-1915 | |
| 5 | EE | Samantha Edirisooriya, Geetani Edirisooriya: Diagnosis of scan path failures. VTS 1995: 250-255 |
| 1993 | ||
| 4 | Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson: On the Performance of Augmented Signature Testing. ISCAS 1993: 1607-1610 | |
| 3 | EE | Geetani Edirisooriya, John P. Robinson: Test generation to minimize error masking. IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 540-549 (1993) |
| 1992 | ||
| 2 | Geetani Edirisooriya, John P. Robinson: Aliasing in Multiple-Valued Test Data Compaction. ISMVL 1992: 43-50 | |
| 1991 | ||
| 1 | Geetani Edirisooriya, John P. Robinson: Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors. ICCD 1991: 352-355 | |
| 1 | Samantha Edirisooriya | [4] [5] [6] |
| 2 | John P. Robinson | [1] [2] [3] [4] |