Patrick Girard

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2008
92EEA. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485
91EEDimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008
90EEAlexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Improving Diagnosis Resolution without Physical Information. DELTA 2008: 210-215
89EEA. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94
2007
88 Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino: Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007 IEEE Computer Society 2007
87EEA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533
86 Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Mixed Approach for Unified Logic Diagnosis. DDECS 2007: 239-242
85EEAlexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: DERRIC: A Tool for Unified Logic Diagnosis. European Test Symposium 2007: 13-20
84EEO. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. European Test Symposium 2007: 77-84
83EEA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104
82EESybille Caffiau, Patrick Girard, Dominique L. Scapin, Laurent Guittet: Generating Interactive Applications from Task Models: A Hard Challenge. TAMODIA 2007: 267-272
81EEA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368
80EEO. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52
79EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
2006
78EELuigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Minimizing test power in SRAM through reduction of pre-charge activity. DATE 2006: 1159-1164
77 Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
76EELoé Sanou, Patrick Girard, Laurent Guittet: Comparaison de deux méthodes pour implémenter la programmation sur exemple. IHM 2006: 265-268
75EENabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich: Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC 2006: 403-408
74EEO. Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113
73EEZahir Albadawi, Benoit Boulet, Robert DiRaddo, Patrick Girard, Alexandre Rail, Vincent Thomson: Agent-based control of manufacturing processes. IJMR 1(4): 466-481 (2006)
72EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Gated Clock Scheme for Low Power Testing of Logic Cores. J. Electronic Testing 22(1): 89-99 (2006)
71EEPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs. J. Electronic Testing 22(2): 161-172 (2006)
70EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
69EELuigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Reducing Power Dissipation in SRAM during Test. J. Low Power Electronics 2(2): 271-280 (2006)
2005
68EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
67EENicolas Guibert, Laurent Guittet, Patrick Girard: Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation. IHM 2005: 147-154
66EENabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549
65EENabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault: Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC 2005: 267-281
64EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
63EEPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs. J. Electronic Testing 21(1): 43-55 (2005)
62EESimone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
61EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
60EEPatrick Girard: Welcome to the Journal of Low Power Electronics. J. Low Power Electronics 1(1): 1-2 (2005)
59EEPatrick Girard, Yannick Bonhomme: Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. J. Low Power Electronics 1(1): 85-95 (2005)
2004
58EENicolas Guibert, Patrick Girard, Laurent Guittet: Example-based programming: a pertinent visual approach for learning to program. AVI 2004: 358-361
57EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
56EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DATE 2004: 62-67
55EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DELTA 2004: 287-294
54EEPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: High Quality TPG for Delay Faults in Look-Up Tables of FPGAs. DELTA 2004: 83-88
53 Yamine Aït Ameur, Benoit Breholée, Patrick Girard, Laurent Guittet, Francis Jambon: Formal Verification and Validation of Interactive Systems Specifications. Human Error, Safety and Systems Development 2004: 61-76
52EEPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. IOLTS 2004: 187-192
51EEMickaël Baron, Patrick Girard: SUIDT: safe user interface design tool. Intelligent User Interfaces 2004: 350-351
50EEBenoit Boulet, Robert DiRaddo, Patrick Girard, Vincent Thomson: An agent based architecture for model based control. SMC (2) 2004: 2002-2007
49EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
2003
48EELuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255
47EEMickaël Baron, Patrick Girard: SUIDT: a user interface builder for secure user interfaces. IHM 2003: 198-201
46EENicolas Guibert, Patrick Girard: Programming by example and computer-aided teaching of algorithmics: the MELBA project. IHM 2003: 248-251
45EEPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Defect Analysis for Delay-Fault BIST in FPGAs. IOLTS 2003: 124-128
44EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC 2003: 488-493
43 Yamine Aït Ameur, Mickaël Baron, Patrick Girard: Formal Validation of HCI User Tasks. Software Engineering Research and Practice 2003: 732-738
2002
42 Patrick Girard, Thomas Baudel, Michel Beaudouin-Lafon, Eric Lecolinet, Dominique L. Scapin: Proceedings of the 14th French-speaking conference on Human-computer interactio n, Conference Francophone sur l'Interaction Homme-Machine, IHM 2002, Poitiers, France, November 26-29, 2002 ACM 2002
41EEYannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Test Power: a Big Issue in Large SOC Designs. DELTA 2002: 447-449
40EEYannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Power Driven Chaining of Flip-Flops in Scan Architectures. ITC 2002: 796-803
39 Mickaël Baron, Patrick Girard: SUIDT: A task model based GUI-Builder. TAMODIA 2002: 64-71
38EERené David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: On Using Efficient Test Sequences for BIST. VTS 2002: 145-152
37EEPatrick Girard: Survey of Low-Power Testing of VLSI Circuits. IEEE Design & Test of Computers 19(3): 82-92 (2002)
36EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich: High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Design & Test of Computers 19(5): 44-52 (2002)
2001
35EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan Testing of Logic ICs or Embedded Cores. Asian Test Symposium 2001: 253-258
34EEFrancis Jambon, Patrick Girard, Yamine Aït Ameur: Interactive System Safety and Usability Enforced with the Development Process. EHCI 2001: 39-56
33EEMickaël Baron, Patrick Girard: Bringing Robustness to End-User Programming. HCC 2001: 142-
32EEGuillaume Patry, Patrick Girard: End-User Programming in a Structured Dialogue Environment: the GIPSE Project. HCC 2001: 212-
31 Guillaume Texier, Laurent Guittet, Patrick Girard: The dialog tool set: a new way to create the dialog component. HCI 2001: 200-204
30EEYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan-Based BIST. IOLTW 2001: 87-89
29 René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Random Adjacent Sequences: An Efficient Solution for Logic BIST. VLSI-SOC 2001: 413-424
28EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Modified Clock Scheme for a Low Power BIST Test Pattern Generator. VTS 2001: 306-311
2000
27EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: An adjacency-based test pattern generator for low power BIST design. Asian Test Symposium 2000: 459-464
26EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126
25EEPatrick Girard: Low Power Testing of VLSI Circuits: Problems and Solutions. ISQED 2000: 173-180
24 Patrick Girard, Christian Landrault, Loïs Guiller, Serge Pravossoudovitch: Low power BIST design by hypergraph partitioning: methodology and architectures. ITC 2000: 652-661
23EELaurent Bréhélin, Olivier Gascuel, Gilles Caraux, Patrick Girard, Christian Landrault: Hidden Markov and Independence Models with Patterns for Sequential BIST. VTS 2000: 359-368
1999
22EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Circuit Partitioning for Low Power BIST Design with Minimized Peak Power Consumption. Asian Test Symposium 1999: 89-94
21 Guillaume Patry, Patrick Girard: GIPSE, A Model-Based System for CAD Software. CADUI 1999: 61-72
20 Francis Jambon, Patrick Girard, Yohann Boisdron: Dialogue Validation from Task Analysis. DSV-IS 1999: 205-224
19EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Ordering Technique for Switching Activity Reduction During Test Operation. Great Lakes Symposium on VLSI 1999: 24-
18EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, P. Teixeira, M. Santos: Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) 1999: 110-113
17EEPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Inhibiting Technique for Low Energy BIST Design. VTS 1999: 407-412
1998
16EEChristophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault: A Ring Architecture Strategy for BIST Test Pattern Generation. Asian Test Symposium 1998: 418-423
15EEPatrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439
14 Yamine Aït Ameur, Patrick Girard, Francis Jambon: A Uniform Approach for Specification and Design of Interactive Systems: the B Method. DSV-IS (2) 1998: 51-67
13 Yamine Aït Ameur, Patrick Girard, Francis Jambon: Using the B Formal Approach for Incremental Specification Design of Interactiv Systems. EHCI 1998: 91-109
1997
12EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A gate resizing technique for high reduction in power consumption. ISLPED 1997: 281-286
11 Christophe Fagot, Patrick Girard, Christian Landrault: On Using Machine Learning for Logic BIST. ITC 1997: 338-346
10EEPatrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch: An optimized BIST test pattern generator for delay testing. VTS 1997: 94-100
9EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A non-iterative gate resizing algorithm for high reduction in power consumption. Integration 24(1): 37-52 (1997)
1996
8 Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms. ITC 1996: 286-293
7EES. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301
1995
6 Yamine Aït Ameur, Frederic Besnard, Patrick Girard, Guy Pierra, Jean-Claude Potier: Formal Specification and Metaprogramming in the EXPRESS Language. SEKE 1995: 181-188
5EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: Diagnostic of path and gate delay faults in non-scan sequential circuits. VTS 1995: 380-386
1994
4 D. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis. EDAC-ETC-EUROASIC 1994: 518-523
1993
3 D. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: An Implicit Delay-Fault Simulation Method with Approximate Detection Threshold Calculation. ITC 1993: 705-713
1992
2EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch: A Novel Approach to Delay-Fault Diagnosis. DAC 1992: 357-360
1EEPatrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay-Fault Diagnosis by Critical-Path Tracing. IEEE Design & Test of Computers 9(4): 27-32 (1992)

Coauthor Index

1Bashir M. Al-Hashimi [69] [78]
2Zahir Albadawi [73]
3Yamine Aït Ameur [6] [13] [14] [34] [43] [53]
4Nabil Badereddine [65] [66] [75]
5Mickaël Baron [33] [39] [43] [47] [51]
6Magali Bastian [68] [77] [79] [81] [83] [87] [89] [92]
7Thomas Baudel [42]
8Michel Beaudouin-Lafon [42]
9Frederic Besnard [6]
10Yohann Boisdron [20]
11Yannick Bonhomme [30] [35] [40] [41] [44] [55] [56] [59] [72]
12Simone Borri [48] [49] [57] [61] [62] [70]
13Alberto Bosio [85] [86] [90]
14Benoit Boulet [50] [73]
15Laurent Bréhélin [23]
16Benoit Breholée [53]
17Sybille Caffiau [82]
18Gilles Caraux [23]
19Marylene Combe [74]
20S. Cremoux [7]
21Jean Michel Daga [74] [80] [84]
22René David [29] [38]
23Robert DiRaddo [50] [73]
24Luigi Dilillo [48] [49] [57] [61] [62] [64] [68] [69] [70] [77] [78] [79]
25D. Dumas [3] [4]
26Christophe Fagot [7] [11] [16]
27Joan Figueras [18]
28Tomasz Garbolino [88]
29Olivier Gascuel [16] [23]
30O. Ginez [74] [80] [84]
31Dimitris Gizopoulos [91]
32V. Gouin [89] [92]
33Elena Gramatová [88]
34Nicolas Guibert [46] [58] [67]
35Loïs Guiller [17] [18] [19] [22] [24] [27] [28] [30] [35] [44] [55] [56] [72]
36Laurent Guittet [31] [53] [58] [67] [76] [82]
37Magali Bastian Hage-Hassan [57] [61] [62] [64] [70]
38Olivier Héron [45] [52] [54] [63] [71]
39Francis Jambon [13] [14] [20] [34] [53]
40Andrzej Krasniewski [88]
41Christian Landrault [1] [2] [3] [4] [5] [7] [8] [9] [10] [11] [12] [15] [16] [17] [18] [19] [22] [23] [24] [26] [27] [28] [29] [30] [35] [36] [38] [40] [41] [44] [55] [56] [65] [66] [72] [74] [75] [80] [81] [83] [84] [85] [86] [87] [90]
42Eric Lecolinet [42]
43Salvador Manich [18]
44V. Moreda [10] [15]
45A. Ney [81] [83] [87] [89] [92]
46Nicola Nicolici [91]
47Guillaume Patry [21] [32]
48Adam Pawlak [88]
49Guy Pierra [6]
50Jean-Claude Potier [6]
51Serge Pravossoudovitch [1] [2] [3] [4] [5] [7] [8] [9] [10] [12] [15] [17] [18] [19] [22] [24] [26] [27] [28] [29] [30] [35] [36] [38] [40] [41] [44] [45] [48] [49] [52] [54] [55] [56] [57] [61] [62] [63] [64] [65] [66] [68] [70] [71] [72] [74] [75] [77] [79] [80] [81] [83] [84] [85] [86] [87] [89] [90] [92]
52Alexandre Rail [73]
53Michel Renovell [45] [52] [54] [63] [71]
54B. Rodriguez [5] [8]
55Paul M. Rosinger [69] [78]
56Alexandre Rousset [85] [86] [90]
57Kaushik Roy [91]
58Loé Sanou [76]
59M. Santos [18]
60Dominique L. Scapin [42] [82]
61D. Severac [9] [12]
62P. Teixeira [18]
63Guillaume Texier [31]
64Vincent Thomson [50] [73]
65Arnaud Virazel [15] [26] [29] [36] [38] [48] [49] [55] [56] [57] [61] [62] [64] [65] [66] [68] [70] [72] [74] [75] [77] [79] [80] [81] [83] [84] [85] [86] [87] [89] [90] [92]
66Xiaoqing Wen [91]
67Hans-Joachim Wunderlich [28] [36] [75]

Colors in the list of coauthors

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