| 2007 |
|---|
| 5 | EE | Simon Wilson,
Ben Flood,
Suresh Goyal,
Jim Mosher,
Susan Bergin,
Joseph O'Brien,
Robert Kennedy:
Parameter Estimation for a Model with Both Imperfect Test and Repair.
VTS 2007: 271-276 |
| 4 | EE | Eric S. Fisher,
Steven Fortune,
Martin K. Gladstein,
Suresh Goyal,
William B. Lyons,
James H. Mosher Jr.,
Gordon T. Wilfong:
Economic modeling of global test strategy I: Mathematical models.
Bell Labs Technical Journal 12(1): 161-173 (2007) |
| 3 | EE | Eric S. Fisher,
Steven Fortune,
Martin K. Gladstein,
Suresh Goyal,
William B. Lyons,
James H. Mosher Jr.,
Gordon T. Wilfong:
Economic modeling of global test strategy II: Software system and examples.
Bell Labs Technical Journal 12(1): 175-186 (2007) |
| 2006 |
|---|
| 2 | EE | Suresh Goyal,
James H. Mosher Jr.:
An improved test process model for cost reduction.
Bell Labs Technical Journal 11(1): 173-190 (2006) |
| 1 | EE | Toby Joyce,
Edward J. Lisay,
David E. Dalton,
Jeff M. Punch,
Michael S. Shellmer,
Shirish N. Kher,
Suresh Goyal:
Piecewise analysis and modeling of circuit pack temperature cycling data.
Bell Labs Technical Journal 11(3): 21-37 (2006) |
