| 2001 | ||
|---|---|---|
| 2 | EE | Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga: An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium 2001: 459 |
| 1996 | ||
| 1 | EE | Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano: A Consistent Scan Design System for Large-Scale ASICs. Asian Test Symposium 1996: 82-87 |
| 1 | Tatsushige Bitoh | [1] |
| 2 | Takashi Kimura | [2] |
| 3 | Akira Kozawa | [2] |
| 4 | Kazushi Nakamura | [1] |
| 5 | Toshinobu Ono | [2] |
| 6 | Koji Saga | [1] [2] |
| 7 | Seiken Yano | [1] |