| 2008 |
| 17 | EE | Yoshiyuki Nakamura,
Kenji Tei,
Yoshiaki Fukazawa,
Shinichi Honiden:
Region-Based Sensor Selection for Wireless Sensor Networks.
SUTC 2008: 326-331 |
| 2007 |
| 16 | EE | Tom Hope,
Masahiro Hamasaki,
Keisuke Ishida,
Noriyuki Fujimura,
Yoshiyuki Nakamura,
Takuichi Nishimura:
Locating Culture in HCI with Information Kiosks and Social Networks.
HCI (10) 2007: 99-107 |
| 15 | EE | Yutaka Matsuo,
Naoaki Okazaki,
Kiyoshi Izumi,
Yoshiyuki Nakamura,
Takuichi Nishimura,
Kôiti Hasida,
Hideyuki Nakashima:
Inferring Long-term User Properties Based on Users' Location History.
IJCAI 2007: 2159-2165 |
| 14 | EE | Yoshiyuki Nakamura,
Thomas Clouqueur,
Kewal K. Saluja,
Hideo Fujiwara:
Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.
IEEE Trans. VLSI Syst. 15(7): 790-800 (2007) |
| 2006 |
| 13 | | Yutaka Matsuo,
Masahiro Hamasaki,
Yoshiyuki Nakamura,
Takuichi Nishimura,
Kôiti Hasida,
Hideaki Takeda,
Junichiro Mori,
Danushka Bollegala,
Mitsuru Ishizuka:
Spinning Multiple Social Networks for Semantic Web.
AAAI 2006 |
| 12 | EE | Masahiro Hamasaki,
Yutaka Matsuo,
Keisuke Ishida,
Yoshiyuki Nakamura,
Takuichi Nishimura,
Hideaki Takeda:
Community Focused Social Network Extraction.
ASWC 2006: 155-161 |
| 11 | EE | Tom Hope,
Masahiro Hamasaki,
Yutaka Matsuo,
Yoshiyuki Nakamura,
Noriyuki Fujimura,
Takuichi Nishimura:
Doing Community: Co-construction of Meaning and Use with Interactive Information Kiosks.
Ubicomp 2006: 387-403 |
| 10 | EE | Yoshiyuki Nakamura,
Jacob Savir,
Hideo Fujiwara:
BIST Pretest of ICs: Risks and Benefits.
VTS 2006: 142-149 |
| 9 | | Kosuke Numa,
Hideaki Takeda,
Takuichi Nishimura,
Yutaka Matsuo,
Masahiro Hamasaki,
Noriyuki Fujimura,
Keisuke Ishida,
Tom Hope,
Yoshiyuki Nakamura,
Satoshi Fujiyoshi,
Kazuya Sakamoto,
Hiroshi Nagata,
Osamu Nakagawa,
Eiji Shinbori:
Context-Aware Weblog to Enhance Communication among Participants in a Conference.
WEBIST (1) 2006: 400-407 |
| 8 | EE | Yoshiyuki Nakamura,
Jacob Savir,
Hideo Fujiwara:
Effect of BIST Pretest on IC Defect Level.
IEICE Transactions 89-D(10): 2626-2636 (2006) |
| 7 | EE | Yoshiyuki Nakamura,
Thomas Clouqueur,
Kewal K. Saluja,
Hideo Fujiwara:
Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch.
IEICE Transactions 89-D(3): 1165-1172 (2006) |
| 2005 |
| 6 | | Yoshiyuki Nakamura,
Nobuo Miyazaki,
Kazuya Sakamoto,
Youichi Motomura,
Takeshi Kurata,
Takuichi Nishimura:
A Location-Based Information Support Infrastructure System using CoBIT.
PSC 2005: 63-70 |
| 5 | EE | Yoshiyuki Nakamura,
Jacob Savir,
Hideo Fujiwara:
Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST.
IEICE Transactions 88-D(6): 1210-1216 (2005) |
| 2004 |
| 4 | EE | Takuichi Nishimura,
Yoshiyuki Nakamura,
Hideo Itoh,
Hideyuki Nakashima:
System Design of Event Space Information Support Utilizing CoBITs.
ICDCS Workshops 2004: 384-387 |
| 3 | EE | Takuichi Nishimura,
Hideo Itoh,
Yoshiyuki Nakamura,
Yoshinobu Yamamoto,
Hideyuki Nakashima:
A Compact Battery-Less Information Terminal for Real World Interaction.
Pervasive 2004: 124-139 |
| 2003 |
| 2 | EE | Yoshiyuki Nakamura,
Takuichi Nishimura,
Hideo Itoh,
Hideyuki Nakashima:
A System of Card Type Battery-Less Information Terminal: CardBIT for Situated Interactio.
PerCom 2003: 369-377 |
| 1997 |
| 1 | EE | Toshinobu Ono,
Kazuo Wakui,
Hitoshi Hikima,
Yoshiyuki Nakamura,
Masaaki Yoshida:
Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs.
Asian Test Symposium 1997: 122-125 |