| 1997 | ||
|---|---|---|
| 3 | Yuhai Ma, Wanchun Shi: OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. ITC 1997: 675-684 | |
| 1996 | ||
| 2 | Yuhai Ma, Wanchun Shi: A Novel Approach to the Analysis of VLSI Device Test Programs. ITC 1996: 471-480 | |
| 1994 | ||
| 1 | Yuning Sun, Xiaoming Wang, Wanchun Shi: An Intelligent Software-Integrated Environment of IC Testing. ITC 1994: 594-603 | |
| 1 | Yuhai Ma | [2] [3] |
| 2 | Yuning Sun | [1] |
| 3 | Xiaoming Wang | [1] |