| 2008 | ||
|---|---|---|
| 1 | EE | Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi, Rubin A. Parekhji: A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. VTS 2008: 53-58 |
| 1 | Rubin A. Parekhji | [1] |
| 2 | Srivaths Ravi | [1] |
| 3 | Abhijeet Shrivastava | [1] |
| 4 | Mahit Warhadpande | [1] |