Jianyin Zhao

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2007

2 EE Jianyin Zhao, Fang Liu: Reliability assessment of the metallized film capacitors from degradation data. Microelectronics Reliability 47(2-3): 434-436 (2007)

2006

1 EE Fang Liu, Bo Guo, Jianyin Zhao: Mission Dependability Modeling and Evaluation of Repairable Systems Considering Maintenance Capacity. ECBS 2006: 327-333

2007
2	EE	Jianyin Zhao, Fang Liu: Reliability assessment of the metallized film capacitors from degradation data. Microelectronics Reliability 47(2-3): 434-436 (2007)
2006
1	EE	Fang Liu, Bo Guo, Jianyin Zhao: Mission Dependability Modeling and Evaluation of Repairable Systems Considering Maintenance Capacity. ECBS 2006: 327-333

Coauthor Index

1 Bo Guo [1]

2 Fang Liu [1] [2]