Kazuki Suzuki
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2002
1
EE
Lihong Tong
, Kazuki Suzuki,
Hideo Ito
: Optimal Seed Generation for Delay Fault Detection BIST.
Asian Test Symposium 2002
: 116-121
Coauthor
Index
1
Hideo Ito
[
1
]
2
Lihong Tong
[
1
]
Copyright ©
Wed Jan 7 16:51:24 2009 by
Michael Ley
(
ley@uni-trier.de
)
