18. FTCS 1988: Tokyo, Japan

• Peter G. Bishop, F. D. Pullen:
  PODS revisited-a study of software failure behaviour. 2-8
  
• John P. J. Kelly, David E. Jr. Eckhardt, Mladen A. Vouk, David F. McAllister, Alper K. Caglayan:
  A large scale second generation experiment in multi-version software: description and early results. 9-14
  
• Algirdas Avizienis, Michael R. Lyu, Werner Schütz:
  In search of effective diversity: a six-language study of fault-tolerant flight control software. 15-22
  
• Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh:
  A sequential circuit test generation using threshold-value simulation. 24-29
  
• Michael H. Schulz, Elisabeth Auth:
  Advanced automatic test pattern generation and redundancy identification techniques. 30-35
  
• Hans-Joachim Wunderlich, Sybille Hellebrand:
  Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits. 36-41
  
• Robert E. Strom, David F. Bacon, Shaula Yemini:
  Volatile logging in n-fault-tolerant distributed systems. 44-49
  
• Kwang-Hae Kim, J. C. Yoon:
  Approaches to implementation of a repairable distributed recovery block scheme. 50-55
  
• Robert F. Cmelik, Narain H. Gehani, William D. Roome:
  Fault tolerant concurrent C: a tool for writing fault tolerant distributed programs. 56-61
  
• Hideo Fujiwara:
  Computational complexity of controllability/observability problems for combinational circuits. 64-69
  
• André Ivanov, Vinod K. Agarwal:
  An iterative technique for calculating aliasing probability of linear feedback signature registers. 70-75
  
• Gabriel M. Silberman, Ilan Y. Spillinger:
  RIDDLE: a foundation for test generation on a high level design description. 76-81
  
• John F. Meyer, Lu Wei:
  Analysis of workload influence on dependability. 84-89
  
• Kamel Barkaoui, Gerard Florin, Céline Fraize, Bernard Lemaire, Stéphane Natkin:
  Reliability analysis of non repairable systems using stochastic Petri nets. 90-95
  
• Marco Mulazzani:
  An open layered architecture for dependability analysis and its application. 96-101
  
• Zary Segall, Dalibor F. Vrsalovic, Daniel P. Siewiorek, David A. Yaskin, J. Kownacki, James H. Barton, R. Dancey, A. Robinson, T. Lin:
  FIAT-fault injection based automated testing environment. 102-107
  
• Vijay S. Iyengar, Donald T. Tang:
  On simulating faults in parallel. 110-115
  
• Shigeharu Teshima, Naoya Chujo, Noriyoshi Sano, Hiroshi Nagase, Mitsuharu Takigawa:
  Accelerated fault simulation by propagating disjoint fault-sets. 116-121
  
• Fadi Maamari, Janusz Rajski:
  A reconvergent fanout analysis for efficient exact fault simulation of combinational circuits. 122-127
  
• Gianpiero Cabodi, Silvano Gai, Marco Mezzalama, Paolo Luca Montessoro, Fabio Somenzi:
  Fault simulation in a multilevel environment: the MOZART approach. 128-133
  
• Bjarne E. Helvik:
  Modelling the influence of unreliable software in distributed computer systems. 136-141
  
• Jean Arlat, Karama Kanoun, Jean-Claude Laprie:
  Dependability evaluation of software fault-tolerance. 142-177
  
• Ken-ichi Matsumoto, Katsuro Inoue, Tohru Kikuno, Koji Torii:
  Experimental evaluation of software reliability growth models. 148-153
  
• Michael Nicolaidis:
  A unified built-in-test scheme: UBIST. 157-163
  
• Rajiv Sharma, Kewal K. Saluja:
  An implementation and analysis of a concurrent built-in self-test technique. 164-169
  
• Naofumi Takagi, Shuzo Yajima:
  An on-line error-detectable array divider with a redundant binary representation and a residue code. 174-179
  
• Suku Nair, Jacob A. Abraham:
  General linear codes for fault-tolerant matrix operations on processor arrays. 180-185
  
• Bernhard G. Zagar, G. Robert Redinbo:
  Watchdog parity channels for digital filter protection. 186-191
  
• Kikuo Fujimura, Pankaj Jalote:
  Robust search methods for B-trees. 194-199
  
• Jean-Claude Fabre, Yves Deswarte, Jean-Claude Laprie, David Powell:
  Saturation: reduced idleness for improved fault-tolerance. 200-205
  
• Flaviu Cristian:
  Agreeing on who is present and who is absent in a synchronous distributed system. 206-211
  
• Sung Je Hong:
  An easily testable parallel multiplier. 214-219
  
• Sandip Kundu, Sudhakar M. Reddy:
  On the design of robust testable CMOS combinational logic circuits. 220-225
  
• Jien-Chung Lo, Suchai Thanawastien:
  The design of fast totally self-checking Berger code checkers based on Berger code partitioning. 226-231
  
• Yuval Tamir, Marc Tremblay, David A. Rennels:
  The implementation and application of micro rollback in fault-tolerant VLSI systems. 234-239
  
• Jaynarayan H. Lala, Linda S. Alger:
  Hardware and software fault tolerance: a unified architectural approach. 240-245
  
• David Powell, Gottfried Bonn, Douglas T. Seaton, Paulo Veríssimo, F. Waeselynck:
  The Delta-4 approach to dependability in open distributed computing systems. 246-251
  
• Richard E. Harper, Jaynarayan H. Lala, John J. Deyst:
  Fault tolerant parallel processor architecture overview. 252-257
  
• Douglas M. Blough, Gregory F. Sullivan, Gerald M. Masson:
  Almost certain diagnosis for intermittently faulty systems. 260-265
  
• Edward F. Schmeichel, S. Louis Hakimi, M. Otsuka, Geoff Sullivan:
  On minimizing testing rounds for fault identification. 266-271
  
• Tohru Kohda, Ken-ichi Abiru:
  A recursive procedure for optimally designing a hybrid fault diagnosable system. 272-277
  
• Sampath Rangarajan, Donald S. Fussell:
  A probabilistic method for fault diagnosis of multiprocessor systems. 278-283
  
• Kurt H. Thearling, Ravi K. Iyer:
  Diagnostic reasoning in digital systems. 286-291
  
• Janusz Rajski:
  GEMINI-a logic system for fault diagnosis based on set functions. 292-297
  
• James T. Blake, Kishor S. Trivedi:
  Reliabilities of two fault-tolerant interconnection networks. 300-305
  
• B. E. Aupperle, John F. Meyer:
  Fault-tolerant BIBD networks. 306-311
  
• Yitzhak Dishon, T. S. Liu:
  Disk dual copy methods and their performance. 314-319
  
• Anujan Varma, Joydeep Ghosh, Christos J. Georgiou:
  Reliable design of large crosspoint switching networks. 320-325
  
• Shantanu Dutt, John P. Hayes:
  Design and reconfiguration strategies for near-optimal k-fault-tolerant tree architectures. 328-333
  
• Masahiro Tsunoyama, Sachio Naito:
  A fault-tolerant parallel processor modeled by a linear cellular automaton. 334-339
  
• Fabrizio Lombardi, Wei-Kang Huang:
  Approaches for the repair of VLSI/WSI RRAMs by row/column deletion. 342-347
  
• Nany Hasan, C. L. Liu:
  Minimum fault coverage in reconfigurable arrays. 348-353
  
• Kazumitsu Matsuzawa, Eiji Fujiwara:
  Masking asymmetric line faults using semi-distance codes. 354-359
  
• Prithviraj Banerjee, Joseph T. Rahmeh, Craig B. Stunkel, V. S. S. Nair, Kaushik Roy, Jacob A. Abraham:
  An evaluation of system-level fault tolerance on the Intel hypercube multiprocessor. 362-367
  
• Shyh-Kwei Chen, Chungti Liang, Wei-Tek Tsai:
  An efficient multi-dimensional grids reconfiguration algorithm on hypercube. 368-373
  
• Tinghuai Chen, Tai Kang, Rong Yao:
  The connectivity of hypergraph and the design of fault-tolerant multibus systems. 374-379
  
• Takashi Nanya, Samiha Mourad, Edward J. McCluskey:
  Multiple stuck-at fault testability of self-testing checkers. 381-386
  

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