23. FTCS 1993: Toulouse, France

System Level Fault Tolerance

• Yennun Huang, Chandra M. R. Kintala: Software Implemented Fault Tolerance Technologies and Experience. 2-9
• Mark Russinovich, Zary Segall, Daniel P. Siewiorek:
  Application Transparent Fault Management in Fault Tolerant Match. 10-19
  
• Inhwan Lee, Ravishankar K. Iyer:
  Faults, Symptoms, and Software Fault Tolerance in the Tandem GUARDIAN90 Operating System. 20-29
  
• Deepak Gupta, Pankaj Jalote:
  Increasing System Availability through On-Line Software Version Change. 30-35
  

Dependability Modeling

• Victor F. Nicola, Perwez Shahabuddin, Philip Heidelberger, Peter W. Glynn:
  Fast Simulation of Steady-State Availability in Non-Markovian Highly Dependable Systems. 38-47
  
• Gerardo Rubino, Bruno Sericola:
  Interval Availability Distribution Computation. 48-55
  
• Meera Balakrishnan, Andrew L. Reibman:
  Characterizing a Lumping Heuristic for a Markov Network Reliability Model. 56-65
  
• Chang Chen, Hiroyuki Asada, Yoshiaki Kakuda, Tohru Kikuno:
  Comparison of Hybrid Modular Redundant Multiprocessor Systems with respect to Performabilitites. 66-75
  

Dependability Measurement and Assessment

• Akira Hachiga, Katsuji Akita, Yutaka Hasegawa:
  The Design Concepts and Operational Results of Fault-tolerant Computer Systems for the Shinkansen Train Control. 78-87
  
• Daniel P. Siewiorek, John J. Hudak, Byung-Hoon Suh, Zary Segall:
  Development of a Benchmark to Measure System Robustness. 88-97
  
• Peter G. Bishop:
  The Variation of Software Survival Time for Different Operational Input Profiles. 98-107
  

Error-Control Coding

• Eiji Fujiwara, Masato Kitakami:
  A Class of Error Locating Codes for Byte-Organized Memory Systems. 110-119
  
• Nitin H. Vaidya:
  Unidirectional Error Control Codes. 120-129
  
• Takashi Matsubara, Yoshiaki Koga:
  A Proposal for Error-Tolerating Codes. 130-136
  

Checkpointing and Recovery

• Yi-Min Wang, Yennun Huang, W. Kent Fuchs:
  Progressive Retry for Software Error Recovery in Distributed Systems. 138-144
  
• Lorenzo Alvisi, Bruce Hoppe, Keith Marzullo:
  Nonblocking and Orphan-Free Message Logging Protocols. 145-154
  
• Bob Janssens, W. Kent Fuchs:
  Relaxing Consistency in Recoverable Distributed Shared Memory. 155-163
  

Testing

• Irith Pomeranz, Sudhakar M. Reddy:
  EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits. 166-175
  
• Ronald D. Blanton, John P. Hayes:
  Efficient Testing of Tree Circuits. 176-185
  
• Rolf Krieger, Bernd Becker, R. Sinkovic:
  A BDD - based Algorithm for Computation of Exact Fault Detection Probabilities. 186-195
  

Fault Injection

• Roy A. Maxion, Robert T. Olszewski:
  Detection and Discrimination of Injected Network Faults. 198-207
  
• Harold A. Rosenberg, Kang G. Shin:
  Software Fault Injection and its Application in Distributed Systems. 208-217
  
• Kumar K. Goswami, Ravishankar K. Iyer:
  Simulation of Software Behaviour Under Hardware Faults. 218-227
  
• David Powell, Eliane Martins, Jean Arlat, Yves Crouzet:
  Estimators for Fault Tolerance Coverage Evaluation. 228-237
  

Fault-Tolerant Networks

• Christopher J. Glass, Lionel M. Ni:
  Fault-Tolerant Wormhole Routing in Meshes. 240-249
  
• Kamal Kantawala, D. L. Tao:
  Designing Concurrent Checking Sorting Networks. 250-259
  
• Jehoshua Bruck, Robert Cypher, Ching-Tien Ho:
  Wildcard Dimensions, Coding Theory and Fault-Tolerant Meshes and Hybercubes. 260-267
  
• Yoshihiro Tohma, Yoichi Koyanagi:
  Design of Neural Networks to Tolerate the Mixture of Two Types of Faults. 268-277
  

Application-Based Fault Tolerance

• Ragini Shamsunder, Daniel J. Rosenkrantz, S. S. Ravi:
  Exploiting Data Flow Information in Algorithm-Based Fault Tolerance. 280-289
  
• Amber Roy-Chowdhury, Prithviraj Banerjee:
  Tolerance Determination for Algorithm-Based Checks Using Simplified Error Analysis Techniques. 290-298
  
• G. Robert Redinbo:
  Optimum Detector/Corrector for Fault-Tolerant Linear Processing. 299-308
  

Simulation and Fault Modeling

• Hungse Cha, Elizabeth M. Rudnick, Gwan S. Choi, Janak H. Patel, Ravishankar K. Iyer:
  A Fast and Accurate Gate-Level Transient Fault Simulation Environment. 310-319
  
• Gwan S. Choi, Ravishankar K. Iyer:
  Wear-Out Simulation Environment for VLSI Designs. 320-329
  
• Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel:
  Theory and Practice of Sequential Machine Testing and Testability. 330-337
  

Built-in-Self-Test and High-Level Testing

• Yervant Zorian, André Ivanov:
  Programmable Space Compaction for BIST. 340-349
  
• Krishnendu Chakrabarty, John P. Hayes:
  Balance Testing of Logic Circuits. 350-359
  
• Nirmal R. Saxena, Ravi Tangirala, Ajay Srivastava:
  Algorithmic Synthesis of High Level Tests for Data Path Designs. 360-369
  
• Praveen Vishakantaiah, Jacob A. Abraham:
  Impact of Behavioral Learning on the Compilation of Sequential Circuit Tests. 370-379
  

Formal Methods and Distributed Algorithms

• Henning Koch:
  An Efficient Replication Protocol Exploiting Logical Tree Structures. 382-391
  
• Antonio Cau, Willem P. de Roever:
  Specifying Fault Tolerance within Stark's Formalism. 392-401
  
• Patrick Lincoln, John M. Rushby:
  A Formally Verified Algorithm for Interactive Consistency Under a Hybrid Fault Model. 402-411
  
• Piotr Berman, Juan A. Garay:
  Randomized Distributed Agreement Revisited. 412-419
  

Dependability and Performance of Storage Systems

• Mark Holland, Garth A. Gibson, Daniel P. Siewiorek:
  Fast, On-Line Failure Recovery in Redundant Disk Arrays. 422-431
  
• Walter A. Burkhard, Jai Menon:
  Disk Array Storage System Reliability. 432-441
  
• Robert Geist, Kishor S. Trivedi:
  An Analytic Treatment of the Reliability and Performance of Mirrored Disk Subsystems. 442-450
  
• Anupam Bhide, Daniel M. Dias, Nagui Halim, T. Basil Smith, Francis N. Parr:
  A Case for Fault-Tolerant Memory for Transaction Processing. 451-460
  

System Level Diagnosis

• Andrzej Pelc:
  Efficient Distributed Diagnosis in the Presence of Random Faults. 462-469
  
• Richard W. Buskens, Ronald P. Bianchini Jr.:
  Distributed On-Line Diagnosis in the Presence of Arbitrary Faults. 470-479
  
• Jae Young Lee, Hee Yong Youn, Adit D. Singh:
  Adaptive Voting for Faulty (VFF) Node Scheme for Distributed Self-Diagnosis. 480-489
  

Testability and Fault Tolerance Synthesis

• Irith Pomeranz, Sudhakar M. Reddy:
  Design and Synthesis for Testability of Synchronous Sequential Circuits Based on Strong-Connectivity. 492-501
  
• Régis Leveugle, R. Rochet, Gabriele Saucier, L. Martinez, C. Pitot:
  A Synthesis Tool for Fault-Tolerant Finite State Machines. 502-511
  
• Ramesh Karri, Alex Orailoglu:
  Optimal Self-Recovering Microarchitecture Synthesis. 512-521
  

Fault-Tolerant Distributed Systems

• Hermann Kopetz, Günter Grünsteidl:
  TTP - A Time-Triggered Protocol for Fault-Tolerant Real-Time Systems. 524-533
  
• André Schiper, Aleta Ricciardi:
  Virtually-Synchronous Communication Based on a Weak Failure Suspector. 534-543
  
• Danny Dolev, Shlomo Kramer, Dalia Malki:
  Early Delivery Totally Ordered Multicast in Asynchronous Environments. 544-553
  
• Birgit Baum-Waidner:
  Byzantine Agreement with a Minimum Number of Messages Both in the Faultless and Worst Case. 554-563
  

Concurrent Error Detection and Data Integrity

• Kent D. Wilken, Timothy Kong:
  Efficient Memory Access Checking. 566-575
  
• Robert W. Horst, Doug Jewett, Daniel Lenoski:
  The Risk of Data Corruption in Microprocessor-based Systems. 576-585
  
• Michael Nicolaidis:
  Efficient Implementations of Self-Checking Adders and ALUs. 586-595
  
• Choong Gun Oh, Hee Yong Youn:
  On Concurrent Error Detection, Location, and Correction of FFT Networks. 596-605
  

Panel: Limits in Dependability

• Jean-Claude Laprie, Gérard Le Lann, Michele Morganti, John M. Rushby:
  Limits in Dependability (Panel). 608-613
  

Practical Experience Reports I

• Dominique Brière, Pascal Traverse:
  AIRBUS A320/A330/A340 Electrical Flight Controls: A Family of Fault-Tolerant Systems. 616-623
  
• Claude Hennebert, Gérard D. Guiho:
  SACEM: A Fault Tolerant System for Train Speed Control. 624-628
  

Practical Experience Reports II

• David Chih-Wei Chang, Nirmal R. Saxena:
  Concurrent Error Detection/Correction in the HAL MMU Chip. 630-635
  
• W. David Shambroom:
  Use of Protocol Validation and Verification Techniques in the Design of a Fault-Tolerant Computer Architecture. 636-640
  
• Philippe David, Claude Guidal:
  Development of a Fault Tolerant Computer System for the HERMES Space Shuttle. 641-646
  

Software Demonstrations I

• Michael R. Lyu, Allen P. Nikora, William H. Farr:
  A Systematic and Comprehensive Tool for Software Reliability Modeling and Measurement. 648-653
  
• Karama Kanoun, Mohamed Kaâniche, Jean-Claude Laprie, Sylvain Metge:
  SoRel: A Tool for Reliability Growth Analysis and Prediction From Statistical Failure Data. 654-659
  
• Yves Eychenne, Michel Simatic, Christophe Baradel, Laurent Junot, Bruno Kohen:
  The Use of Object Groups to Implement Dependability in a Process Control Supervision System. 660-665
  

Software Demonstrations II

• C. Béoumes, Karama Kanoun, Martine Aguera, Jean-Claude Laprie, Jean Arlat, Sylvain Metge, S. Bachmann, Jorge Moreira de Souza, C. Bourdeau, David Powell, J.-E. Doucet, P. Spiesser:
  SURF-2: A Program for Dependability Evaluation of Complex Hardware and Software Systems. 668-673
  
• William H. Sanders, W. Douglas Obal II:
  Dependability Evaluation Using UltraSAN. 674-679
  
• Marc Bouissou:
  The FIGARO Dependability Evaluation Workbench in Use: Case Studies for Fault-Tolerant Computer Systems. 680-685
  

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