3. ICST 2010:
Paris, France
Third International Conference on Software Testing, Verification and Validation, ICST 2010, Paris, France, April 7-9, 2010.
IEEE Computer Society 2010, ISBN 978-0-7695-3990-4
Keynote Speakers
- Odile Laurent:
Using Formal Methods and Testability Concepts in the Avionics Systems Validation and Verification (V&V) Process.
1-10

- Patrick Copeland:
Google's Innovation Factory: Testing, Culture, and Infrastructure.
11-14

Model Based Testing 1
Mutation Testing
Regression Testing 1
Model Based Testing 2
UML Modeling and Testing
- Ivan Porres, Irum Rauf:
From Nondeterministic UML Protocol Statemachines to Class Contracts.
107-116

- Stephan Weißleder:
Simulated Satisfaction of Coverage Criteria on UML State Machines.
117-126

Regression Testing 2
Test Assessment 1
Test Process and Tools 1
Test and Validation 1
GUI Testing
Test Assessment 2
Testing and Validation 2
Ph.D. Symposium 1
- Shekoufeh Kolahdouz Rahimi:
Specification of UML Model Transformations.
323-326

- Michael Mlynarski:
Holistic Model-Based Testing for Business Information Systems.
327-330

- Diana Elena Vega:
Towards an Automated and Dynamically Adaptable Test System for Testing Healthcare Information Systems.
331-334

Testing Safety and Security
Ph.D. Symposium 2
- Jussi Kasurinen:
Elaborating Software Test Processes and Strategies.
355-358

- Vidar Slåtten:
Model-Driven Engineering of Dependable Systems.
359-362

Testing Web Services and Applications
Test Assessment 3
- Mijung Kim, Saurabh Sinha, Carsten Görg, Hina Shah, Mary Jean Harrold, Mangala Gowri Nanda:
Automated Bug Neighborhood Analysis for Identifying Incomplete Bug Fixes.
383-392

- Adnan Causevic, Daniel Sundmark, Sasikumar Punnekkat:
An Industrial Survey on Contemporary Aspects of Software Testing.
393-401

- Fevzi Belli, Michael Linschulte, Christof J. Budnik, Harald A. Stieber:
Fault Detection Likelihood of Test Sequence Length.
402-411

Test Management and Vulnerabilities Detection
Model Based Testing 3
Test Assessment 4
Testing and Validation 3
Ph.D. Symposium 3
- Muhammad-Naeem Irfan:
State Machine Inference in Testing Context with Long Counterexamples.
508-511

- Emelie Engstrom:
Regression Test Selection and Product Line System Testing.
512-515

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