12. IOLTS 2006:
Como, Italy
12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy.
IEEE Computer Society 2006, ISBN 0-7695-2620-9 
Keynote Talk
- Andrea Cuomo:
The Challenge of Reliability in Future Complex Systems.
3
Invited Talk
- Norbert Seifert:
Extending Moore's Law into the next Decade - the SER Challenge.
7
Session 1:
Fault Effects and Self-Checking Techniques
- Damien Leroy, Stanislaw J. Piestrak, Fabrice Monteiro, Abbas Dandache, Stéphane Rossignol, Pascal Moitrel:
Characterizing Laser-Induced Pulses in ICs: Methodology and Results.
11-16
- Cecilia Metra, Martin Omaña, Daniele Rossi, José Manuel Cazeaux, T. M. Mak:
Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation.
17-22
- Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider.
23-30
Session 2:
BIST Techniques
Session 3:
Technology Robustness
- G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi:
Erratic Effects of Irradiation in Floating Gate Memory Cells.
51-56
- Tino Heijmen, Damien Giot, Philippe Roche:
Factors That Impact the Critical Charge of Memory Elements.
57-62
- Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.
63-74
Special Session 1:
Memory Reliability Challenges
Special Session 2:
Test and Reliability Challenges for Innovative Systems
- T. M. Mak:
Test Challenges for 3D Circuits.
79
- Marcello Coppola:
Trends and Trade-offs in Designing Highly Robust Throughput on Chip Communication Network.
80
- Magdy S. Abadir:
Floorplanning and Thermal Impact on Leakage Power and Proper Operation of Complex SOC Designs.
81
- Isaac Levendel:
The Consequences of Variability in Software.
82
Panel 1
Embedded Tutorials:
Innovative Design for Robustness
- Melanie Berg:
Fault Tolerance Implementation within SRAM Based FPGA Design Based upon the Increased Level of Single Event Upset Susceptibility.
89-91
- Marc Renaudin, Yannick Monnet:
Asynchronous Design: Fault Robustness and Security Characteristics.
92-95
Session 4:
Soft Errors and Latchup Mitigation
Session 5:
Secure Circuits
- David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre:
Secure Scan Techniques: A Comparison.
119-124
- Yannick Monnet, Marc Renaudin, Régis Leveugle, Nathalie Feyt, Pascal Moitrel, F. M'Buwa Nzenguet:
Practical Evaluation of Fault Countermeasures on an Asynchronous DES Crypto Processor.
125-130
- Konrad J. Kulikowski, Mark G. Karpovsky, Alexander Taubin:
Power Attacks on Secure Hardware Based on Early Propagation of Data.
131-138
Session 6:
Fault Detection Techniques
Session 7:
Analog Circuits Dependability
Session 8:
Posters
- Steffen Tarnick:
Embedded Borden 2-UED Code Checkers.
173-175
- Luca Breveglieri, Paolo Maistri, Israel Koren:
A Note on Error Detection in an RSA Architecture by Means of Residue Codes.
176-177
- Gian-Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
Localization of Faults in Radix-n Signed Digit Adders.
178-180
- Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus:
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
181-182
- Mario García-Valderas, Marta Portela-García, Celia López-Ongil, Luis Entrena:
Emulation-based Fault Injection in Circuits with Embedded Memories.
183-184
- Pavel Kubalík, Petr Fiser, Hana Kubatova:
Fault Tolerant System Design Method Based on Self-Checking Circuits.
185-186
- S. Habermann, René Kothe, Heinrich Theodor Vierhaus:
Built-in Self Repair by Reconfiguration of FPGAs.
187-188
- Luca Sterpone, Massimo Violante:
Dependability Evaluation of Transient Fault Effects in Reconfigurable Compute Fabric Devices.
189-190
- Arthur Pereira Frantz, Luigi Carro, Érika F. Cota, Fernanda Lima Kastensmidt:
Evaluating SEU and Crosstalk Effects in Network-on-Chip Routers.
191-192
- Dimitris Nikolos, Dimitrios Kagaris, Spyros Gidaros:
Diophantine-Equation Based Arithmetic Test Set Embedding.
193-194
- Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis:
Design of a Robust 8-Bit Microprocessor to Soft Errors.
195-196
Panel 2
Session 9:
Reliable Systems
Session 10:
Dependability Analysis
Session 11:
New Topics in Fault Detection
- Alexander V. Drozd, M. V. Lobachev, J. V. Drozd:
The Problem of On-Line Testing Methods In Approximate Data Processing.
251-256
- Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira:
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.
257-262
- Deepali Koppad, Danil Sokolov, Alexandre V. Bystrov, Alexandre Yakovlev:
Online Testing by Protocol Decomposition.
263-268
Special Session 3:
SER Trends:
Vision and Developments from European IDMs
Session 12:
Checkers and Error Correction
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