13. ISSRE 2002: Annapolis, MD, USA

Session 1A: Testing with Formal Methods

• Grégory Lestiennes, Marie-Claude Gaudel:
  Testing Processes from Formal Specifications with Inputs, Outputs and Data Types. 3-14
  
• Tim Menzies, David Owen, Bojan Cukic:
  Saturation Effects in Testing of Formal Models. 15-26
  
• Guillaume Lussier, Hélène Waeselynck:
  Informal Proof Analysis Towards Testing Enhancement. 27-40
  

Session 2A: Reliability Modeling

• Wen-Li Wang, Mei-Hwa Chen:
  Heterogeneous Software Reliability Modeling. 41-52
  
• Kirk Sayre, Jesse H. Poore:
  A Reliability Estimator for Model Based Software Testing. 53-63
  
• Swapna S. Gokhale, Kishor S. Trivedi:
  Reliability Prediction and Sensitivity Analysis Based on Software Architecture. 64-78
  

Session 3A: Failure Detection and Recovery

• Reinhard Klemm, Navjot Singh:
  Automatic Failure Detection, Logging, and Recovery for High-Availability Java Servers. 79-90
  
• Subhachandra Chandra, Peter M. Chen:
  The Impact of Recovery Mechanisms on the Likelihood of Saving Corrupted State. 91-101
  
• Christof Fetzer, Zhen Xiao:
  A Flexible Generator Architecture for Improving Software Dependability. 102-116
  

Session 1B: Assessment of Testing

• James B. Michael, Bernard J. Bossuyt, Byron B. Snyder:
  Metrics for Measuring the Effectiveness of Software-Testing Tools. 117-128
  
• Chin-Yu Huang, Jung-Hua Lo, Sy-Yen Kuo, Michael R. Lyu:
  Optimal Allocation of Testing Resources for Modular Software Systems. 129-138
  
• Osamu Mizuno, Eijiro Shigematsu, Yasunari Takagi, Tohru Kikuno:
  On Estimating Testing Effort Needed to Assure Field Quality in Software Development. 139-148
  

Session 2B: High Availability Software Maintenance

• Lizhou Yu, Gholamali C. Shoja, Hausi A. Müller, Anand Srinivasan:
  A Framework for Live Software Upgrade. 149-158
  
• Yun Liu, Kishor S. Trivedi, Yue Ma, James J. Han, Haim Levendel:
  Modeling and Analysis of Software Rejuvenation in Cable Modem Termination Systems. 159-170
  
• Hiroyuki Okamura, Satoshi Miyahara, Tadashi Dohi:
  Dependability Analysis of a Client/Server Software System with Rejuvenation. 171-182
  

Session 1C: Testing Technologies

• Ponrudee Netisopakul, Lee J. White, John Morris, Daniel Hoffman:
  Data Coverage Testing of Programs for Container Classes. 183-194
  
• Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon:
  Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment. 195-206
  
• Roger T. Alexander, Jeff Offutt, James M. Bieman:
  Fault Detection Capabilities of Coupling-based OO Testing. 207-220
  

Session 2C: System Analysis

• Taghi M. Khoshgoftaar:
  Improving Usefulness of Software Quality Classification Models Based on Boolean Discriminant Functions. 221-230
  
• Dingding Lu, Robyn R. Lutz:
  Fault Contribution Trees for Product Families. 231-242
  
• Ganesh J. Pai, Joanne Bechta Dugan:
  Automatic Synthesis of Dynamic Fault Trees from UML System Models. 243-256
  

Session 1D: Practical Experience with Testing

• Marc Fisher II, Dalai Jin, Gregg Rothermel, Margaret M. Burnett:
  Test Reuse in the Spreadsheet Paradigm. 257-268
  
• Giuliano Antoniol, Lionel C. Briand, Massimiliano Di Penta, Yvan Labiche:
  A Case Study Using the Round-Trip Strategy for State-Based Class Testing. 269-279
  
• Satya Kanduri, Sebastian G. Elbaum:
  An Empirical Study of Tracing Techniques from a Failure Analysis Perspective. 280-294
  

Session 2D: Reliability Prediction and Analysis

• Peter G. Bishop, Robin E. Bloomfield:
  Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects. 295-303
  
• Michael Grottke:
  A Vector Markov Model for Structural Coverage Growth and the Number of Failure Occurrences. 304-315
  
• Yu Lei, Kuo-Chung Tai:
  Blocking-based Simultaneous Reachability Analysis of Asynchronous Message-passing Programs. 316-328
  

Session 1E: Software Mutation

• João Durães, Henrique Madeira:
  Emulation of Software Faults by Educated Mutations at Machine-Code Level. 329-340
  
• Roger T. Alexander, James M. Bieman, Sudipto Ghosh, Bixia Ji:
  Mutation of Java Objects. 341-351
  
• Yu-Seung Ma, Yong Rae Kwon, Jeff Offutt:
  Inter-Class Mutation Operators for Java. 352-366
  

Session 2E: Reliability Assessment

• Farokh B. Bastani, Sung Kim, I-Ling Yen, Ing-Ray Chen:
  Reliability Assessment of Framework-Based Distributed Embedded Software Systems. 367-376
  
• João W. Cangussu, Aditya P. Mathur, Raymond A. DeCarlo:
  Effect of Disturbances on the Convergence of Failure Intensity. 377-387
  
• John C. Munson, Allen P. Nikora:
  Toward A Quantifiable Definition of Software Faults. 388-396