19. ISSRE 2008: Seattle/Redmond, WA, USA
19th International Symposium on Software Reliability Engineering (ISSRE 2008), 11-14 November 2008, Seattle/Redmond, WA, USA. IEEE Computer Society 2008
Keynotes
- Solom Heddaya: How Economics Shape Reliability: Lessons and Opportunities from Windows Development. 1
- Russell Morris: Software Reliability - 40 Years of Avoiding the Question. 2-3
- Victor R. Basili: Using Measures and Risk Indicators for Early Insight into Software Product Characteristics such as Software Safety. 4-5
Panel
- Michael G. Hinchey, Karama Kanoun, Mikael Lindvall, Michael R. Lyu, Tiziana Margaria, Veena B. Mendiratta, Paul Pettersson, Norman F. Schneidewind, W. Eric Wong: Anything You Want to Ask about Software Reliability Engineering. 6
Models 1
- Michael Kläs, Haruka Nakao, Frank Elberzhager, Jürgen Münch: Predicting Defect Content and Quality Assurance Effectiveness by Combining Expert Judgment and Defect Data - A Case Study. 17-26
- W. Eric Wong, Yan Shi, Yu Qi, Richard Golden: Using an RBF Neural Network to Locate Program Bugs. 27-36
Java 1
- Kinga Dobolyi, Westley Weimer: Changing Java's Semantics for Handling Null Pointer Exceptions. 47-56
Models 2
- Edward Condon, Angela He, Michel Cukier: Analysis of Computer Security Incident Data Using Time Series Models. 77-86
- João Antunes, Nuno Ferreira Neves, Paulo Veríssimo: Detection and Prediction of Resource-Exhaustion Vulnerabilities. 87-96
Network & OS
- Leonardo Mariani, Fabrizio Pastore: Automated Identification of Failure Causes in System Logs. 117-126
- Constantin Sârbu, Andréas Johansson, Neeraj Suri, Nachiappan Nagappan: Profiling the Operational Behavior of OS Device Drivers. 127-136
Testing 1
- Ben Breech, Lori L. Pollock, John Cavazos: RUGRAT: Runtime Test Case Generation Using Dynamic Compilers. 137-146
- Nikolai Kosmatov: All-Paths TestGenerationfor Programs with Internal Aliases. 147-156
- Ilinca Ciupa, Bertrand Meyer, Manuel Oriol, Alexander Pretschner: Finding Faults: Manual Testing vs. Random+ Testing vs. User Reports. 157-166
Test 2
- Eduardo Cunha de Almeida, Gerson Sunyé, Yves Le Traon, Patrick Valduriez: A Framework for Testing Peer-to-Peer Systems. 167-176
- Brian Robinson, Lee J. White: Testing of User-Configurable Software Systems Using Firewalls. 177-186
- Boya Sun, Ray-Yaung Chang, Xianghao Chen, Andy Podgurski: Automated Support for Propagating Bug Fixes. 187-196
Empirical 1
- Fadi Wedyan, Sudipto Ghosh: A Joinpoint Coverage Measurement Tool for Evaluating the Effectiveness of Test Inputs for AspectJ Programs. 207-212
- Kirsi Korhonen, Outi Salo: Exploring Quality Metrics to Support Defect Management Process in a Multi-site Organization - A Case Study. 213-218
- Robin E. Bloomfield, Ilir Gashi, Andrey Povyakalo, Vladimir Stankovic: Comparison of Empirical Data from Two Honeynets and a Distributed Honeypot Network. 219-228
Testing 3
- Sam Weber, Amitkumar Paradkar, Suzanne McIntosh, David C. Toll, Paul A. Karger, Matthew Kaplan, Elaine R. Palmer: The Feasibility of Automated Feedback-Directed Specification-Based Test Generation: A Case Study of a High-Assurance Operating System. 229-238
- Prasanth Anbalagan, Tao Xie: Automated Generation of Pointcut Mutants for Testing Pointcuts in AspectJ Programs. 239-248
- Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, Don S. Batory: Testing Software Product Lines Using Incremental Test Generation. 249-258
Empirical 2
- Alexander Tarvo: Using Statistical Models to Predict Software Regressions. 259-264
- Paul Luo Li, Mingtian Ni, Song Xue, Joseph P. Mullally, Mario Garzia, Mujtaba Khambatti: Reliability Assessment of Mass-Market Software: Insights from Windows Vista®. 265-270
Fast Abstract - Reliability
- Lily Huang, Michael R. Smith, Albert Tran, James Miller: E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products. 277-278
- Dalju Lee, Jongmoon Baik, Hoyeon Ryu, Ju-Hwan Shin: An Effective Software Reliability Analysis Framework for Weapon System Development in Defense Domain. 279-280
- Chao-Jung Hsu, Chin-Yu Huang, Tsan-Yuan Chen: A Modified Genetic Algorithm for Parameter Estimation of Software Reliability Growth Models. 281-282
- Jingyu Kim, Sungwon Kang, Nohbok Lee: Reliability Assessment of Translated VMF/Link-16 Messages. 283-284
- Ning Huang, Dong Wang, Xiaoguang Jia: An Algebra-Based Reliability Prediction Approach for Composite Web Services. 285-286
- Felix Salfner, Katinka Wolter: Replication vs. Failure Prevention - How to Boost Service Availability? 289-290
Fast Abstract - Security & Safety
- Tomohiko Takagi, Zengo Furukawa: GB Coverage Criteria: The Measurement for Testing a "Go Back" Function Based on a Pushdown Automaton. 293-294
- Syed Shariyar Murtaza, Mechelle Gittens, Nazim H. Madhavji: Discovering the Fault Origin from Field Traces. 295-296
- HyunChul Joh, Yashwant K. Malaiya: Seasonality in Vulnerability Discovery in Major Software Systems. 297-298
- HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya: Vulnerability Discovery Modeling Using Weibull Distribution. 299-300
- Christopher Ackermann, Deane E. Sibol, William C. Stratton, Mikael Lindvall, Sally Godfrey: An Analysis Framework for Inter-system Interaction Behavior. 301-302
- Nuo Li, Patrick Francis, Brian Robinson: Static Detection of Redundant Test Cases: An Initial Study. 303-304
Student Program
- Gursimran Singh Walia, Jeffrey C. Carver: The Effect of the Number of Defects on Estimates Produced by Capture-Recapture Models. 305-306
- Chu-Ti Lin, Chin-Yu Huang: Modeling the Software Failure Correlations When Test Automation Is Adopted during the Software Development. 307-308
- Aritra Bandyopadhyay, Sudipto Ghosh: Using UML Sequence Diagrams and State Machines for Test Input Generation. 309-310
- Meiyappan Nagappan, Mladen A. Vouk, Kesheng Wu, Alex Sim, Arie Shoshani: Efficient Operational Profiling of Systems Using Suffix Arrays on Execution Logs. 313-314
- Hideaki Hata, Osamu Mizuno, Tohru Kikuno: Comparative Study of Fault-Proneness Filtering with PMD. 317-318
- Haifeng Li, Qiuying Li, Minyan Lu: Software Reliability Modeling with Logistic Test Coverage Function. 319-320
- Albert Tran, Michael R. Smith, James Miller: A Hardware-Assisted Tool for Fast, Full Code Coverage Analysis. 321-322
- Dazhi Zhang, Wenhua Wang, Donggang Liu, Yu Lei, David Chenho Kung: Reusing Existing Test Cases for Security Testing. 323-324
- Prasanth Anbalagan, Mladen A. Vouk: On Reliability Analysis of Open Source Software - FEDORA. 325-326
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2013-06-19T203413 by the dblp team