DEFECTS 2008: Seattle, WA, USA

Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann (Eds.): Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008. ACM 2008, ISBN 978-1-60558-051-7

Technical papers

Nathaniel Ayewah, William Pugh:
A report on a survey and study of static analysis users. 1-5
Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue:
Predicting fault-prone modules based on metrics transitions. 6-10
Timea Illes-Seifert, Barbara Paech:
Exploring the relationship of history characteristics and defect count: an empirical study. 11-15
Yue Jiang, Bojan Cukic, Tim Menzies:
Can data transformation help in the detection of fault-prone modules? 16-20
Rudolf Ramler:
The impact of product development on the lifecycle of defects. 21-25
Burak Turhan, Ayse Basar Bener, Tim Menzies:
Nearest neighbor sampling for cross company defect predictors: abstract only. 26
Elaine J. Weyuker, Thomas J. Ostrand:
Comparing methods to identify defect reports in a change management database. 27-31
Chadd C. Williams, Jaime Spacco:
SZZ revisited: verifying when changes induce fixes. 32-36

Short papers

Yasuhiro Hayase, Yii Yong Lee, Katsuro Inoue:
A criterion for filtering code clone related bugs. 37-38
Stefan Wagner:
Defect classification and defect types revisited. 39-40
Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue:
Retrieving similar code fragments based on identifier similarity for defect detection. 41-42
Min Zhang, Tracy Hall, Nathan Baddoo, Paul Wernick:
Do bad smells indicate "trouble" in code? 43-44