ISSTA 2009: Chicago, IL, USA
Gregg Rothermel, Laura K. Dillon (Eds.): Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, Chicago, IL, USA, July 19-23, 2009. ACM 2009 ISBN 978-1-60558-338-9
Static analysis and verification
Martin Bravenboer, Yannis Smaragdakis: Exception analysis and points-to analysis: better together. 1-12

Testing #1
Yoram Adler, Eitan Farchi, Moshe Klausner, Dan Pelleg, Orna Raz, Moran Shochat, Shmuel Ur, Aviad Zlotnick: Advanced code coverage analysis using substring holes. 37-46
Charles Pecheur, Franco Raimondi, Guillaume Brat: A formal analysis of requirements-based testing. 47-56
Akbar Siami Namin, James H. Andrews: The influence of size and coverage on test suite effectiveness. 57-68
Empirical studies
David Schuler, Valentin Dallmeier, Andreas Zeller: Efficient mutation testing by checking invariant violations. 69-80
Lingxiao Jiang, Zhendong Su: Automatic mining of functionally equivalent code fragments via random testing. 81-92
Nadia Polikarpova, Ilinca Ciupa, Bertrand Meyer: A comparative study of programmer-written and automatically inferred contracts. 93-104
Testing and analysis tools #1
Adam Kiezun, Vijay Ganesh, Philip J. Guo, Pieter Hooimeijer, Michael D. Ernst: HAMPI: a solver for string constraints. 105-116
Andreas Sæbjørnsen, Jeremiah Willcock, Thomas Panas, Daniel J. Quinlan, Zhendong Su: Detecting code clones in binary executables. 117-128
Bassem Elkarablieh, Patrice Godefroid, Michael Y. Levin: Precise pointer reasoning for dynamic test generation. 129-140
Fault localization
Hong Cheng, David Lo, Yang Zhou, Xiaoyin Wang, Xifeng Yan: Identifying bug signatures using discriminative graph mining. 141-152
Saurabh Sinha, Hina Shah, Carsten Görg, Shujuan Jiang, Mijung Kim, Mary Jean Harrold: Fault localization and repair for Java runtime exceptions. 153-164
Testing #2
Sandro Fouché, Myra B. Cohen, Adam A. Porter: Incremental covering array failure characterization in large configuration spaces. 177-188
Christian Murphy, Kuang Shen, Gail E. Kaiser: Automatic system testing of programs without test oracles. 189-200
Shin Yoo, Mark Harman, Paolo Tonella, Angelo Susi: Clustering test cases to achieve effective and scalable prioritisation incorporating expert knowledge. 201-212
Lu Zhang, Shan-Shan Hou, Chao Guo, Tao Xie, Hong Mei: Time-aware test-case prioritization using integer linear programming. 213-224
Testing and analysis tools #2
Prateek Saxena, Pongsin Poosankam, Stephen McCamant, Dawn Song: Loop-extended symbolic execution on binary programs. 225-236
Anton Babenko, Leonardo Mariani, Fabrizio Pastore: AVA: automated interpretation of dynamically detected anomalies. 237-248
James A. Clause, Alessandro Orso: Penumbra: automatically identifying failure-relevant inputs using dynamic tainting. 249-260
Domain-specific testing techniques
Lorenzo Martignoni, Roberto Paleari, Giampaolo Fresi Roglia, Danilo Bruschi: Testing CPU emulators. 261-272
Jewgenij Botaschanjan, Benjamin Hummel: Specifying the worst case: orthogonal modeling of hardware errors. 273-284
William G. J. Halfond, Saswat Anand, Alessandro Orso: Precise interface identification to improve testing and analysis of web applications. 285-296



