ISSTA 2009: Chicago, IL, USA

Static analysis and verification

• Martin Bravenboer, Yannis Smaragdakis:
  Exception analysis and points-to analysis: better together. 1-12
  
• Zachary Stengel, Tevfik Bultan:
  Analyzing singularity channel contracts. 13-24
  
• Martin Th Görg, Jianjun Zhao:
  Identifying semantic differences in AspectJ programs. 25-36
  

Testing #1

• Yoram Adler, Eitan Farchi, Moshe Klausner, Dan Pelleg, Orna Raz, Moran Shochat, Shmuel Ur, Aviad Zlotnick:
  Advanced code coverage analysis using substring holes. 37-46
  
• Charles Pecheur, Franco Raimondi, Guillaume Brat:
  A formal analysis of requirements-based testing. 47-56
  
• Akbar Siami Namin, James H. Andrews:
  The influence of size and coverage on test suite effectiveness. 57-68
  

Empirical studies

• David Schuler, Valentin Dallmeier, Andreas Zeller:
  Efficient mutation testing by checking invariant violations. 69-80
  
• Lingxiao Jiang, Zhendong Su:
  Automatic mining of functionally equivalent code fragments via random testing. 81-92
  
• Nadia Polikarpova, Ilinca Ciupa, Bertrand Meyer:
  A comparative study of programmer-written and automatically inferred contracts. 93-104
  

Testing and analysis tools #1

• Adam Kiezun, Vijay Ganesh, Philip J. Guo, Pieter Hooimeijer, Michael D. Ernst:
  HAMPI: a solver for string constraints. 105-116
  
• Andreas Sæbjørnsen, Jeremiah Willcock, Thomas Panas, Daniel J. Quinlan, Zhendong Su:
  Detecting code clones in binary executables. 117-128
  
• Bassem Elkarablieh, Patrice Godefroid, Michael Y. Levin:
  Precise pointer reasoning for dynamic test generation. 129-140
  

Fault localization

• Hong Cheng, David Lo, Yang Zhou, Xiaoyin Wang, Xifeng Yan:
  Identifying bug signatures using discriminative graph mining. 141-152
  
• Saurabh Sinha, Hina Shah, Carsten Görg, Shujuan Jiang, Mijung Kim, Mary Jean Harrold:
  Fault localization and repair for Java runtime exceptions. 153-164
  
• Bin Xin, Xiangyu Zhang:
  Memory slicing. 165-176
  

Testing #2

• Sandro Fouché, Myra B. Cohen, Adam A. Porter:
  Incremental covering array failure characterization in large configuration spaces. 177-188
  
• Christian Murphy, Kuang Shen, Gail E. Kaiser:
  Automatic system testing of programs without test oracles. 189-200
  
• Shin Yoo, Mark Harman, Paolo Tonella, Angelo Susi:
  Clustering test cases to achieve effective and scalable prioritisation incorporating expert knowledge. 201-212
  
• Lu Zhang, Shan-Shan Hou, Chao Guo, Tao Xie, Hong Mei:
  Time-aware test-case prioritization using integer linear programming. 213-224
  

Testing and analysis tools #2

• Prateek Saxena, Pongsin Poosankam, Stephen McCamant, Dawn Song:
  Loop-extended symbolic execution on binary programs. 225-236
  
• Anton Babenko, Leonardo Mariani, Fabrizio Pastore:
  AVA: automated interpretation of dynamically detected anomalies. 237-248
  
• James A. Clause, Alessandro Orso:
  Penumbra: automatically identifying failure-relevant inputs using dynamic tainting. 249-260
  

Domain-specific testing techniques

• Lorenzo Martignoni, Roberto Paleari, Giampaolo Fresi Roglia, Danilo Bruschi:
  Testing CPU emulators. 261-272
  
• Jewgenij Botaschanjan, Benjamin Hummel:
  Specifying the worst case: orthogonal modeling of hardware errors. 273-284
  
• William G. J. Halfond, Saswat Anand, Alessandro Orso:
  Precise interface identification to improve testing and analysis of web applications. 285-296