ITC 1986: Washington, D.C., USA

Keynote Speaker

Invited Speakers

Session 1: Design Techniques for Built-In-Self Test

Session 2: Using Test Data for Process Improvement

Session 3: Test Generation Approaches and Algorithms

Session 4: Meeting the Performance and Complexity Challenge of VLSI

Session 5: Trends and Tradeoffs in Test Economics

Session 6: Poster Session

Session 7: Panel Sesion: Advanced Burn-In and Life Test Techniques

Session 9: Analysis Techniques for Built-In-Self-Test

Session 10: Advances in Board Test Technology

Session 11: Modeling, Simulation, and Design Verification

Session 12: Testing the Newest Generation of Microprocessors

Session 13: Quality and Reliability

Session 14: Design for Testability-Methods and Measures

Session 15A: CMOS Modeling, Test Generation, and Fault Simulation

Session 16A: Inexpensive Testing Techniques

Session 16B: Advanced Test Approaches and Methods

Session 17: CAE and Workstation

Session 18: Advanced Testing of Analog-Digital Devices and Systems

Session 19A: Design for Testability-PLAs, Scan Paths, and Verification Techniques

Session 19B: Panel Session: Deterministic Versus Random Testing

Session 20: Artificial Intelligence Applications to Test-part I

Session 21: Accuracy and Performance-They'll Get You Every Time!

Session 22: Memory Test-From FIFO to Video

Session 23: Software Solutions to Testing Challenges

Session 24: Systems Test

Session 25: Artificial Intelligence Applications to Test-Part II

Session 26: search Techniques That You Can Use!