ITC 1990: Washington, DC, USA

• Akihiko Yamada:
  Challenge of design and test of ultra-large-scale circuits. 23
  
• Janusz Rajski, Henry Cox:
  A method to calculate necessary assignments in algorithmic test pattern generation. 25-34
  
• Miron Abramovici, David T. Miller, R. Henning:
  Global cost functions for test generation. 35-43
  
• John A. Waicukauski, Paul A. Shupe, David Giramma, Arshad Matin:
  ATPG for ultra-large structured designs. 44-51
  
• Paolo Camurati, Davide Medina, Paolo Prinetto, Matteo Sonza Reorda:
  A diagnostic test pattern generation algorithm. 52-58
  
• David K. Oka:
  Analog test requirements of linear echo cancellation ISDN devices. 59-67
  
• Luis A. Bonet, J. Ganger, Jim Girardeau, Carlos Greaves, M. Pendleton, David Yatim:
  Test features of the MC145472 ISDN U-transceivers. 68-79
  
• Billy W. Sprinkle:
  Fast and accurate testing of ISDN S/T interface devices using pseudo error rate techniques. 80-85
  
• Kenneth Lanier:
  ATE-based functional ISDN testing. 86-94
  
• Gordon Sapp:
  ASSIST (Allied Signal's Standardized Integrated Scan Test). 95-102
  
• Endre F. Sarkany, Robert F. Lusch:
  Innovative techniques for improved testability. 103-108
  
• John Sweeney:
  Testability implemented in the VAX 6000 model 400. 109-114
  
• Chul J. Choi:
  Scan based guided probe technology delivers Cyclone to the market. 115-119
  
• David L. Landis, Padmaraj Singh:
  Optimal placement of IEEE 1149.1 test port and boundary scan resources for wafer scale integration. 120-126
  
• Johann Maierhofer:
  Hierarchical self-test concept based on the JTAG standard. 127-134
  
• Lee Whetsel:
  Event qualification: a gateway to at-speed system testing. 135-141
  
• C. Thomas Glover:
  Mixed-mode ATPG under input constraints. 142-151
  
• Chau-Chin Su, Charles R. Kime:
  Multiple path sensitization for hierarchical circuit testing. 152-161
  
• Kwang-Ting Cheng, Jing-Yang Jou:
  Functional test generation for finite state machines. 162-168
  
• T. Michael Souders, Gerard N. Stenbakken:
  A comprehensive approach for modeling and testing analog and mixed-signal devices. 169-176
  
• Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga:
  From specification to measurement: the bottleneck in analog industrial testing. 177-182
  
• Mani Soma:
  A design-for-test methodology for active analog filters. 183-192
  
• Alan C. Walker:
  Stress profile derivation-an empirical approach. 193-207
  
• Frank J. Langley, C. A. Robinson, R. A. Passero:
  Automatic electro-optical testing of automobile dashboard displays in a factory environment. 208-213
  
• Durwin Gill:
  Time margin issues in disk drive testing. 214-221
  
• Kenneth P. Parker, Stig Oresjo:
  A language for describing boundary-scan devices. 222-234
  
• Frans de Jong:
  Boundary scan test used at board level: moving towards reality. 235-242
  
• Don Sterba, Andy Halliday, Don McClean:
  ATPG issues for board designs implementing boundary scan. 243-251
  
• Steven D. McEuen:
  Why, I_DDQ? [CMOS IC testing]. 252
  
• Keith Baker, Bas Verhelst:
  I_DDQ testing because `zero defects isn't enough': a Philips perspective. 253-254
  
• Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
  Zero defects or zero stuck-at faults-CMOS IC process improvement with I_DDQ. 255-256
  
• Wojciech Maly:
  Current testing. 257
  
• Al Lowenstein, Steve Schlosser, Greg Winter:
  Concurrent engineering. 258-259
  
• Melvin A. Breuer:
  Obstacles and an approach towards concurrent engineering. 260-261
  
• Noel E. Donlin:
  QML (qualified manufacturing line): a method of providing high quality integrated circuits. 262-263
  
• Robert W. Thomas:
  Test engineers role in QML. 264
  
• Janusz Rajski, Jagadeesh Vasudevamurthy:
  Testability preserving transformations in multi-level logic synthesis. 265-273
  
• Abhijit Ghosh, Srinivas Devadas, A. Richard Newton:
  Sequential logic synthesis for testability using register-transfer level descriptions. 274-283
  
• Srinivas Devadas, Kurt Keutzer:
  Design of integrated circuits fully testable for delay-faults and multifaults. 284-293
  
• Mark F. Lefebvre:
  Functional test and diagnosis: a proposed JTAG sample mode scan tester. 294-303
  
• Matthew L. Fichtenbaum, Gordon D. Robinson:
  Scan test architectures for digital board testers. 304-310
  
• Chi W. Yau, Najmi T. Jarwala:
  The boundary-scan master: target applications and functional requirements. 311-315
  
• Michael Nicolaidis:
  Efficient UBIST implementation for microprocessor sequencing parts. 316-326
  
• Yasuyuki Nozuyama:
  Realization of an efficient design verification test used on a microinstruction controlled self test. 327-336
  
• Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, Wai-on Law:
  Testability considerations in the design of the MC68340 Integrated Processor Unit. 337-346
  
• Sheng-Jen Tsai, Wha-Joon Lee:
  A high-speed pin-memory architecture using multiport dynamic RAMs. 347-354
  
• Burnell West, Tom Napier:
  Sequencer Per Pin test system architecture. 355-361
  
• David C. Keezer:
  Multiplexing test system channels for data rates above 1 Gb/s. 362-368
  
• Bong-Hee Park, Premachandran R. Menon:
  Design of scan-testable CMOS sequential circuits. 369-376
  
• Vivek Chickermane, Janak H. Patel:
  An optimization based approach to the partial scan design problem. 377-386
  
• Weiwei Mao, Michael D. Ciletti:
  Arrangement of latches in scan-path design to improve delay fault coverage. 387-393
  
• Grant L. Castrodale, Apostolos Dollas, William T. Krakow:
  An interactive environment for the transparent logic simulation and testing of integrated circuits. 394-403
  
• Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani:
  ASIC CAD system based on hierarchical design-for-testability. 404-409
  
• Ajit Agrawal, Debashis Bhattacharya:
  CMP3F: a high speed fault simulator for the Connection Machine. 410-416
  
• Kuen-Jong Lee, Melvin A. Breuer:
  On the charge sharing problem in CMOS stuck-open fault testing. 417-426
  
• Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
  Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets. 427-435
  
• F. Joel Ferguson, Martin Taylor, Tracy Larrabee:
  Testing for parametric faults in static CMOS circuits. 436-443
  
• Leslie Ackner, Mark R. Barber:
  Frequency enhancement of digital VLSI test systems. 444-451
  
• Phil Burlison:
  Criteria for analyzing high frequency testing performance of VLSI automatic test equipment. 452-461
  
• Donald F. Murray, C. Michael Nash:
  Critical parameters for high-performance dynamic response measurements. 462-471
  
• Math Muris:
  Integrating boundary scan test into an ASIC design flow. 472-477
  
• J. Morris Chang:
  A study of the optimization of DC parametric tests. 478-487
  
• Venkata R. Immaneni, Srinivas Raman:
  Direct access test scheme-design of block and core cells for embedded ASICs. 488-492
  
• H. Kato:
  Color reproduction test for CCD image sensors. 493-497
  
• Jack Weimer, Kevin Baade, John Fitzsimmons, Brian Lowe:
  A rapid dither algorithm advances A/D converter testing. 498-507
  
• Jun Kurita, Nobuyuki Kasuga, Kiyoyasu Hiwada:
  An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing. 508-513
  
• Anthony Taylor:
  An analysis of ATE computational architecture. 514-519
  
• Jens Leenstra, Lambert Spaanenburg:
  Hierarchical test assembly for macro based VLSI design. 520-529
  
• Don Organ:
  enVision: the inside story. 530-536
  
• Ove Brynestad, Einar J. Aas, Anne E. Vallestad:
  State transition graph analysis as a key to BIST fault coverage. 537-543
  
• Albrecht P. Stroele, Hans-Joachim Wunderlich:
  Error masking in self-testable circuits. 544-552
  
• John C. Chan, Jacob A. Abraham:
  A study of faulty signatures using a matrix formulation. 553-561
  
• L. Klein, J. Bridgeman:
  An architecture for high-speed analog in-circuit testing. 562-564
  
• Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu:
  Diagnosis for wiring interconnects. 565-571
  
• Gordon D. Robinson, John G. Deshayes:
  Interconnect testing of boards with partial boundary scan. 572-581
  
• Bulent I. Dervisoglu:
  Towards a standard approach for controlling board-level test functions. 582-590
  
• Ravi Rastogi, Kenneth F. Sierzega:
  A new approach to mixed-signal diagnosis. 591-597
  
• Ram Bobba, B. Stevens:
  Fast embedded A/D converter testing using the microcontroller's resources. 598-604
  
• David T. Crook:
  A fourth generation analog incircuit program generator. 605-612
  
• Yasuo Furukawa, Makoto Kimura, Masao Sugai, Shinichi Kimura, Michael Purtell:
  Jitter minimization technique for mixed signal testing. 613-619
  
• Y. M. Mastoris, P. D. Nash:
  Networking verification process and environments: an extension of the product realization process for new network capabilities. 620-626
  
• Miroslaw Malek, Banu Özden:
  Optimized testing of meshes. 627-637
  
• Mark G. Karpovsky, Lev B. Levitin, Feodor S. Vainstein:
  Identification of faulty processing elements by space-time compression of test responses. 638-647
  
• Don R. Allen:
  Failure probability algorithm for test systems to reduce false alarms. 648-656
  
• Jacob Savir, William H. McAnney:
  A multiple seed linear feedback shift register. 657-659
  
• Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie:
  A new procedure for weighted random built-in self-test. 660-669
  
• Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl:
  Generating pseudo-exhaustive vectors for external testing. 670-679
  
• Chau-Chin Su, Charles R. Kime:
  Computer-aided design of pseudoexhaustive BIST for semiregular circuits. 680-689
  
• Leendert M. Huisman, Raja Daoud:
  Fault simulation of logic designs on parallel processors with distributed memory. 690-697
  
• William H. Nicholls, Arnold W. Nordsieck, Mani Soma:
  Experimental evaluation of concurrent fault simulation algorithms on scalable, hierarchically defined test cases. 698-705
  
• Ohyoung Song, Premachandran R. Menon:
  Parallel pattern fault simulation based on stem faults in combinational circuits. 706-711
  
• Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal:
  An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited. 712-720
  
• Robert L. Hickling:
  Extending binary searches to two and three dimensions [IC testing]. 721-725
  
• Jacob Savir:
  AC product defect level and yield loss. 726-738
  
• R. Mehtani, Keith Baker, C. M. Huizer, P. J. Hynes, Jos van Beers:
  Macro-testability and the VSP. 739-748
  
• Michael G. Gallup, William Ledbetter Jr., Ralph McGarity, Steve McMahan, Kenneth Scheuer, Clark G. Shepard, Lal Sood:
  Testability features of the 68040. 749-757
  
• Naga Gollakota, Ahmad Zaidi:
  Fault grading the Intel 80486. 758-761
  
• Paul H. Bardell:
  Analysis of cellular automata used as pseudorandom pattern generators. 762-768
  
• Jos van Sas, Francky Catthoor, Hugo De Man:
  Cellular automata based self-test for programmable data paths. 769-778
  
• Kazuhiko Iwasaki, Noboru Yamaguchi:
  Design of signature circuits based on weight distributions of error-correcting codes. 779-785
  
• Sheldon B. Akers, Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan:
  Why is less information from logic simulation more useful in fault simulation? 786-800
  
• Fadi Maamari, Janusz Rajski:
  The dynamic reduction of fault simulation. 801-808
  
• Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen:
  Single-fault fault collapsing analysis in sequential logic circuits. 809-814
  
• Hiroki Koike, Toshio Takeshima, Masahide Takada:
  A BIST scheme using microprogram ROM for large capacity memories. 815-822
  
• Thierry Viacroze, Marc Lequeux:
  Analysis of failures on memories using expert system techniques. 823-832
  
• Pinaki Mazumder, Jih-Shyr Yih:
  A novel built-in self-repair approach to VLSI memory yield enhancement. 833-841
  
• Thomas M. Storey, Wojciech Maly:
  CMOS bridging fault detection. 842-851
  
• V. Chandramouli, Ravi K. Gulati, Ramaswami Dandapani, Deepak K. Goel:
  Bridging faults and their implication to PLAs. 852-859
  
• Steven D. Millman, Edward J. McCluskey, John M. Acken:
  Diagnosing CMOS bridging faults with stuck-at fault dictionaries. 860-870
  
• Yervant Zorian, André Ivanov:
  EEODM: An effective BIST scheme for ROMs. 871-879
  
• Narumi Sakashita, Hisako Sawai, Eiichi Teraoka, Toshiki Fugiyama, Toru Kengaku, Yukihiko Shimazu, Takeshi Tokuda:
  Built-in self-test in a 24 bit floating point digital signal processor. 880-885
  
• Thomas M. Schwair, Hartmut C. Ritter:
  Complete self-test architecture for a coprocessor [cryptography]. 886-890
  
• Joseph A. Mielke, Keith A. Pope:
  High-speed fixture interconnects for mixed-signal IC testing. 891-895
  
• Samuel Schleifer:
  Improving wafer sort yields with radius-tip probes. 896-899
  
• T. Tada, R. Takagi, S. Nakao, M. Hyozo, T. Arakawa, K. Sawada, M. Ueda:
  A fine pitch probe technology for VLSI wafer testing. 900-906
  
• Paul Mullenix:
  The capability of capability indices with an application to guardbanding in a test environment. 907-915
  
• Michael P. Palumbo:
  Technique for transfer of analog prototypes (DV's) to production. 916-923
  
• Yolanda T. Hadeed, Kevin T. Lewis:
  The use of tolerance intervals in the characterization of semiconductor devices. 924-928
  
• R. Meershoek, Bas Verhelst, Rory McInerney, Loek Thijssen:
  Functional and I_DDQ testing on a static RAM. 929-937
  
• Ashish Pancholy, Janusz Rajski, Larry J. McNaughton:
  Empirical failure analysis and validation of fault models in CMOS VLSI. 938-947
  
• Etienne Sicard, Kozo Kinoshita:
  On the evaluation of process-fault tolerance ability of CMOS integrated circuits. 948-954
  
• Xiaoqing Wen, Kozo Kinoshita:
  A testable design of logic circuits under highly observable condition. 955-963
  
• Tsu-Wei Ku, Mani Soma:
  Minimal overhead modification of iterative logic arrays for C-testability. 964-969
  
• Rafic Z. Makki, Krisbnm Palaniswami:
  Practical partitioning for testability with time-shared boundary scan. 970-977
  
• Larry Moran, Robert Hillman, Phil Burlison, Tom Gurda:
  The Waveform and Vector Exchange Specification (WAVES). 978-987
  
• William W. Sebesta, Bas Verhelst, Michael G. Wahl:
  Development of a new standard for test. 988-993
  
• Masahiro Handa, Russel L. Steinweg:
  Wave+: An easy-to-use vector generation language for compilers. 994-999
  
• J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter:
  Weighted random test program generation for a per-pin tester. 1000-1005
  
• Robert B. Elo:
  An empirical relationship between test transparency and fault coverage. 1006-1011
  
• Raoul Velazco, Catherine Bellon, Bernard Martinet:
  Failure coverage of functional test methods: a comparative experimental evaluation. 1012-1017
  
• Richard H. Williams, Charles F. Hawkins:
  Errors in testing. 1018-1027
  
• Roberto Menozzi, Mattia Lanzoni, Luca Selmi, Bruno Riccò:
  An improved procedure to test CMOS ICs for latch-up. 1028-1034
  
• Mitsuru Shinagawa, Tadao Nagatsuma:
  A picosecond external electro-optic prober using laser diodes. 1035-1039
  
• Arthur Hu, Hironobu Niijima:
  New approach to integrate LSI design databases with e-beam tester. 1040-1048
  
• Norio Kuji, Kiyoshi Matsumoto:
  Marginal fault diagnosis based on e-beam static fault imaging with CAD interface. 1049-1054
  
• Prab Varma:
  TDRC-a symbolic simulation based design for testability rules checker. 1055-1064
  
• Takuji Ogihara, Yasushi Koseko, Genichi Yonemori, Hiroyuki Kawai:
  Testable design and support tool for cell based test. 1065-1071
  
• Harald Gundlach, Klaus D. Müller-Glaser:
  On automatic testpoint insertion in sequential circuits. 1072-1079
  

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