VTS 2008: San Diego, CA, USA

• Qingqi Dou, Jacob A. Abraham:
  Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems. 3-8
  
• Muhammad Mudassar Nisar, Abhijit Chatterjee:
  Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. 9-16
  
• Dongwoo Hong, Kwang-Ting (Tim) Cheng:
  Bit-Error Rate Estimation for Bang-Bang Clock and Data Recovery Circuit in High-Speed Serial Links. 17-22
  
• François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh:
  How Many Test Patterns are Useless? 23-28
  
• Emil Gizdarski:
  Constructing Augmented Multimode Compactors. 29-34
  
• Ritesh Garg, Richard Putman, Nur A. Touba:
  Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation. 35-42
  
• Intaik Park, Donghwi Lee, Erik Chmelar, Edward J. McCluskey:
  Inconsistent Fail due to Limited Tester Timing Accuracy. 47-52
  
• Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi, Rubin A. Parekhji:
  A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. 53-58
  
• Zhaoliang Pan, Melvin A. Breuer:
  Basing Acceptable Error-Tolerant Performance on Significance-Based Error-rate (SBER). 59-66
  
• King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman:
  Diagnosis of Scan Clock Failures. 67-72
  
• Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang:
  An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. 73-78
  
• Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
  On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. 79-84
  
• Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
  An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. 89-94
  
• Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
  An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. 95-100
  
• Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy:
  Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. 101-106
  
• Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra:
  Gate-Oxide Early Life Failure Prediction. 111-118
  
• Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
  Full Open Defects in Nanometric CMOS. 119-124
  
• Uranmandakh Amgalan, Christian Hachmann, Sybille Hellebrand, Hans-Joachim Wunderlich:
  Signature Rollback - A Technique for Testing Robust Circuits. 125-130
  
• Anshuman Chandra, Rohit Kapur:
  Bounded Adjacent Fill for Low Capture Power Scan Testing. 131-138
  
• Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak:
  Reducing Scan Shift Power at RTL. 139-146
  
• Yu-Ze Wu, Mango Chia-Tso Chao:
  Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes. 147-154
  
• Apurva Mishra, Mani Soma:
  A Time-Domain Method for Pseudo-Spectral Characterization. 163-168
  
• Chen-Wei Lin, Jiun-Lang Huang:
  A Built-In TFT Array Charge-Sensing Technique for System-on-Panel Displays. 169-174
  
• Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
  Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. 175-180
  
• Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng:
  Automatic Test Pattern Generation for Interconnect Open Defects. 181-186
  
• Stelios Neophytou, Maria K. Michael:
  On the Relaxation of n-detect Test Sets. 187-192
  
• Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
  Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. 193-198
  
• Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham:
  Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors. 203-208
  
• Erdem Serkan Erdogan, Sule Ozev:
  Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. 209-214
  
• Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
  ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. 215-220
  
• Irith Pomeranz, Sudhakar M. Reddy:
  Synthesis for Broadside Testability of Transition Faults. 221-226
  
• Jeremy Lee, Mohammad Tehranipoor:
  LS-TDF: Low-Switching Transition Delay Fault Pattern Generation. 227-232
  
• Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
  Test-Pattern Grading and Pattern Selection for Small-Delay Defects. 233-239
  
• Zheng Wang, D. M. H. Walker:
  Dynamic Compaction for High Quality Delay Test. 243-248
  
• Ming-Chien Tsai, Ching-Hwa Cheng, Chiou-Mao Yang:
  An All-Digital High-Precision Built-In Delay Time Measurement Circuit. 249-254
  
• Jaekwang Lee, Intaik Park, Edward J. McCluskey:
  Error Sequence Analysis. 255-260
  
• Yao-Hsin Chou, Sy-Yen Kuo, I-Ming Tsai:
  QBIST: Quantum Built-in Self-Test for any Boolean Circuit. 261-266
  
• James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark Reed, Yiorgos Makris:
  A Statistical Approach to Characterizing and Testing Functionalized Nanowires. 267-274
  
• Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi:
  A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies. 275-282
  
• Byoungho Kim, Nash Khouzam, Jacob A. Abraham:
  Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. 293-298
  
• Sounil Biswas, R. D. (Shawn) Blanton:
  Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. 299-308
  
• Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
  Parallel Loopback Test of Mixed-Signal Circuits. 309-316
  
• Irith Pomeranz, Sudhakar M. Reddy:
  Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests. 317-322
  
• Manoj Kumar Goparaju, Spyros Tragoudas:
  A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates. 323-328
  
• Rajamani Sethuram, Michael L. Bushnell, Vishwani D. Agrawal:
  Fault Nodes in Implication Graph for Equivalence/Dominance Collapsing, and Identifying Untestable and Independent Faults. 329-335
  
• Desta Tadesse, R. Iris Bahar, Joel Grodstein:
  Fast Measurement of the "Non-Deterministic Zone" in Microprocessor Debug Using Maximum Likelihood Estimation. 339-344
  
• Joon-Sung Yang, Nur A. Touba:
  Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture. 345-351
  
• Chia-Chih Yen, Ten Lin, Hermes Lin, Kai Yang, Ta-Yung Liu, Yu-Chin Hsu:
  A General Failure Candidate Ranking Framework for Silicon Debug. 352-358
  
• Carlos Arthur Lang Lisbôa, Costas Argyrides, Dhiraj K. Pradhan, Luigi Carro:
  Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms. 363-370
  
• Michael Nicolaidis, Renaud Perez, Dan Alexandrescu:
  Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. 371-376
  
• Ying Zhang, Huawei Li, Xiaowei Li, Yu Hu:
  Codeword Selection for Crosstalk Avoidance and Error Correction on Interconnects. 377-382
  
• Minjin Zhang, Huawei Li, Xiaowei Li:
  Multiple Coupling Effects Oriented Path Delay Test Generation. 383-388
  
• Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
  A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. 389-394
  
• I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty:
  An Industrial Case Study of Sticky Path-Delay Faults. 395-402