Cengiz Özcan

	1990
2		Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421
1		Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn: Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225

Coauthor Index

1	Wilfried Daehn	[1] [2]
2	Torsten Grüning	[1] [2]
3	Udo Mahlstedt	[1] [2]