D. Abessolo-Bidzo

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2005

1 D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)

	2005
1		D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)

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