M. J. Abou-Khalil

	2006
1		D. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)

Coauthor Index

1	D. Alvarez	[1]
2	Kiran V. Chatty	[1]
3	Robert Gauthier	[1]
4	R. Halbach	[1]
5	D. Kontos	[1]
6	J. Li	[1]
7	C. Russ	[1]
8	C. Seguin	[1]