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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. O. D. Acevedo, Jaime Ramírez-Angulo: Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard. ISCAS (1) 2002: 149-152

Coauthor Index

1Jaime Ramírez-Angulo [1]

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