Pablo E. Acevedo

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2006

1 Pablo E. Acevedo, Donald S. Jackson, Robert W. Kotlowitz: Reliability growth and forecasting for critical hardware through accelerated life testing. Bell Labs Technical Journal 11(3): 121-135 (2006)

	2006
1		Pablo E. Acevedo, Donald S. Jackson, Robert W. Kotlowitz: Reliability growth and forecasting for critical hardware through accelerated life testing. Bell Labs Technical Journal 11(3): 121-135 (2006)

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