Jan Ackaert

	2003
2		Jan Ackaert, Klara Bessemans, Eddy De Backer: Charging induced damage by photoconduction through thick inter metal dielectrics. Microelectronics Reliability 43(9-11): 1525-1529 (2003)
	2001
1		Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens: Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectronics Reliability 41(9-10): 1403-1407 (2001)

Coauthor Index

1	Eddy De Backer	[1] [2]
2	Klara Bessemans	[2]
3	P. Colson	[1]
4	Peter Coppens	[1]
5	Z. Wang	[1]