 | 2009 |
|---|
| 10 |       | Benoit Nadeau-Dostie,
Saman Adham,
Russ Abbott:
Improved Core Isolation and Access for Hierarchical Embedded Test.
IEEE Design & Test of Computers 26(1): 18-25 (2009) |
| 2004 |
|---|
| 9 | | Saman Adham,
Benoit Nadeau-Dostie:
A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs.
MTDT 2004: 98-101 |
| 1999 |
|---|
| 8 | | Bernard Antaki,
Yvon Savaria,
Nanhan Xiong,
Saman Adham:
Design For Testability Method for CML Digital Circuits.
DATE 1999: 360-367 |
| 7 | | Yuejian Wu,
Saman Adham:
Scan-based BIST fault diagnosis.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 203-211 (1999) |
| 1998 |
|---|
| 6 | | Dhamin Al-Khalili,
Saman Adham,
Come Rozon,
Moazzem Hossain,
D. Racz:
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.
DFT 1998: 84-92 |
| 5 | | José M. Miranda,
Scott Davidson,
Peter Dziel,
Saman Adham,
Steve Millman:
Test Reuse at System Level.
VTS 1998: 318-319 |
| 1996 |
|---|
| 4 | | Saman Adham,
Sanjay Gupta:
DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique.
Asian Test Symposium 1996: 205-212 |
| 3 |  | Yuejian Wu,
Saman Adham:
BIST Fault Diagnosis in Scan-Based VLSI Environments.
ITC 1996: 48-57 |
| 1995 |
|---|
| 2 | | Harry Hulvershorn,
Paul Soong,
Saman Adham:
Linking Diagnostic Software to Hardware Self Test in Telecom Systems.
ITC 1995: 986-993 |
| 1 | | Benoit Nadeau-Dostie,
Harry Hulvershorn,
Saman Adham:
A New Hardware Fault Insertion Scheme for System Diagnostics Verification.
ITC 1995: 994-1002 |
