Kranthi Mitra Adusumilli

	2005
2		Walter J. Trybula, Robert L. Wright, Kranthi Mitra Adusumilli, Randy K. Goodall: An analysis: traditional semiconductor lithography versus emerging technology (nano imprint). Winter Simulation Conference 2005: 2218-2222
	2004
1		Kranthi Mitra Adusumilli, Robert L. Wright: Comparative Factory Analysis of Standard FOUP Capacities. Winter Simulation Conference 2004: 1930-

Coauthor Index

1	Randy K. Goodall	[2]
2	Walter J. Trybula	[2]
3	Robert L. Wright	[1] [2]