Mridul Agarwal

	2007
3		Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra: Circuit Failure Prediction and Its Application to Transistor Aging. VTS 2007: 277-286
	2006
2		Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw: Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1273-1288 (2006)
	2005
1		Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw: Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506

Coauthor Index

1	Kanak Agarwal	[1] [2]
2	David Blaauw (David T. Blaauw)	[1] [2]
3	Subhasish Mitra	[3]
4	Bipul Chandra Paul (Bipul C. Paul)	[3]
5	Dennis Sylvester	[1] [2]
6	Ming Zhang	[3]

Colors in the list of coauthors