Vinod K. Agarwal

	1999
61		Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal: Correct diagnosis of almost all faulty units in a multiprocessor system. ISCAS (6) 1999: 161-164
60		Vinod K. Agarwal: Invited Talk: Embedded Test for Systems-on-a-Chip. VLSI Design 1999
59		Vinod K. Agarwal: VTS 1999 Keynote Address Embedded Test OR External Test. VTS 1999: 2-7
	1998
58		Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman: Diagnosis of clustered faults and wafer testing. IEEE Trans. on CAD of Integrated Circuits and Systems 17(2): 136-148 (1998)
57		Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal: Correct Diagnosis of Almost All Faulty Units in a Multiprocessor System. Journal of Circuits, Systems, and Computers 8(4): 473-481 (1998)
	1997
56		Vinod K. Agarwal: Embedded Test and Measurement Critical for Deep Submicron Technology. Asian Test Symposium 1997: 2-
	1995
55		Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes: Distributed Probabilistic Diagnosis of MCMs on Large Area. ITC 1995: 208-216
54		Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt: A Specification-Driven Architectural Design Environment. IEEE Computer 28(6): 26-35 (1995)
53		Vinod K. Agarwal: VTS 1994 Panel Report on BIST for Consumer Products. IEEE Design & Test of Computers 12(1): 12- (1995)
52		Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge, Krishnaiyan Thulasiraman: A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing. IEEE Trans. Parallel Distrib. Syst. 6(4): 363-372 (1995)
51		D. Lambidonis, André Ivanov, Vinod K. Agarwal: Fast signature computation for BIST linear compactors. IEEE Trans. on CAD of Integrated Circuits and Systems 14(8): 1037-1044 (1995)
50		D. Lambidonis, Vinod K. Agarwal, André Ivanov, Dhiren Xavier: A quasi-optimal scheduling of intermediate signatures for multiple signature analysis compaction testing schemes. J. Electronic Testing 6(1): 75-84 (1995)
	1994
49		Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt: DASE: An Environment for System Level Telecommunication Design Exploration and Modelling. CAST 1994: 302-318
48		Guoning Liao, Erik R. Altman, Vinod K. Agarwal, Guang R. Gao: A Comparative Study of Multiprocessor List Scheduling Heuristics. HICSS (1) 1994: 68-77
47		Morie E. Malowany, Gordon W. Roberts, Vinod K. Agarwal: VAMP: A Hierarchical Framework for Design for Manufacturability. ISCAS 1994: 141-144
46		Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal: Performance of Interconnection Network in Multithreaded Architectures. PARLE 1994: 823-826
45		Laurence E. LaForge, Kaiyuan Huang, Vinod K. Agarwal: Almost Sure Diagnosis of Almost Every Good Element. IEEE Trans. Computers 43(3): 295-305 (1994)
44		Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal: Diagnosis of t/(t+1)-Diagnosable Systems. SIAM J. Comput. 23(5): 895-905 (1994)
	1993
43		Erik R. Altman, Vinod K. Agarwal, Guang R. Gao: A Novel Methodology Using Genetic Algorithms for the Design of Caches and Cache Replacement Policy. ICGA 1993: 392-399
42		Robert P. Treuer, Vinod K. Agarwal: Fault Location Algorithms for Repairable Embedded. ITC 1993: 825-834
41		Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal: Analysis of Multithreaded Multiprocessors with Distributed Shared Memory. SPDP 1993: 114-121
40		Robert P. Treuer, Vinod K. Agarwal: Built-In Self-Diagnosis for Repairable Embedded RAMs. IEEE Design & Test of Computers 10(2): 24-33 (1993)
39		Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal, K. B. Lakshmanan: Multiprocessor Fault Diagnosis Under Local Constraints. IEEE Trans. Computers 42(8): 984-988 (1993)
38		Anindya Das, Krishnaiyan Thulasiraman, K. B. Lakshmanan, Vinod K. Agarwal: Distributed Fault diagnosis of a Ring of Processors. Parallel Processing Letters 3: 195-204 (1993)
	1992
37		Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge: Wafer Testing with Pairwise Comparisons. FTCS 1992: 374-383
36		Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal: Performance Evaluation of Latency Tolerant Architectures. ICCI 1992: 183-186
35		Arun K. Somani, Vinod K. Agarwal: Distributed Diagnosis Algorithms for Regular Interconnected Structures. IEEE Trans. Computers 41(7): 899-906 (1992)
34		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 16-25 (1992)
33		Abu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski: BIST of PCB interconnects using boundary-scan architecture. IEEE Trans. on CAD of Integrated Circuits and Systems 11(10): 1278-1288 (1992)
	1991
32		D. Lambidonis, André Ivanov, Vinod K. Agarwal: Fast Signature Computation for Linear Compactors. ITC 1991: 808-817
31		André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams: Iterative algorithms for computing aliasing probabilities. IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 260-265 (1991)
	1990
30		Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal: Serial Interfacing for Embedded-Memory Testing. IEEE Design & Test of Computers 7(2): 52-63 (1990)
29		Yervant Zorian, Vinod K. Agarwal: Optimizing error masking in BIST by output data modification. J. Electronic Testing 1(1): 59-71 (1990)
	1989
28		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: : Experiments on Aliasing in Signature Analysis Registers. ITC 1989: 344-354
27		Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie: Testing of Glue Logic Interconnects Using Boundary Scan Architecture. ITC 1989: 700-711
26		Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal, K. B. Lakshmanan: t/s-Diagnosable Systems: A Characterization and Diagnosis Algorithm. WG 1989: 34-45
25		Arun K. Somani, Vinod K. Agarwal, David Avis: On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems. IEEE Trans. Computers 38(2): 195-201 (1989)
24		André Ivanov, Vinod K. Agarwal: An analysis of the probabilistic behavior of linear feedback signature registers. IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1074-1088 (1989)
	1988
23		Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski: Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. ITC 1988: 126-137
22		Henry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski: On Multiple Fault Coverage and Aliasing Probability Measures. ITC 1988: 314-321
21		Michael C. Howells, Vinod K. Agarwal: A Reconfiguration Scheme for Yield Enhancement of Large Area Binary Tree Architectures. IEEE Trans. Computers 37(4): 463-468 (1988)
20		André Ivanov, Vinod K. Agarwal: Dynamic testability measures for ATPG. IEEE Trans. on CAD of Integrated Circuits and Systems 7(5): 598-608 (1988)
	1987
19		Robert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara: A New Built-In Self-Test Design for PLA's with High Fault Coverage and Low Overhead. IEEE Trans. Computers 36(3): 369-373 (1987)
18		Arun K. Somani, Vinod K. Agarwal, David Avis: A Generalized Theory for System Level Diagnosis. IEEE Trans. Computers 36(5): 538-546 (1987)
	1986
17		André Ivanov, Vinod K. Agarwal: Testability Measures : What Do They Do for ATPG ? ITC 1986: 129-139
16		A. S. Mahmudul Hassan, Vinod K. Agarwal: A Fault-Tolerant Modular Architecture for Binary Trees. IEEE Trans. Computers 35(4): 356-361 (1986)
15		Michel Dagenais, Vinod K. Agarwal, Nicholas C. Rumin: McBOOLE: A New Procedure for Exact Logic Minimization. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 229-238 (1986)
	1985
14		Michel Dagenais, Vinod K. Agarwal, Nicholas C. Rumin: The McBOOLE logic minimizer. DAC 1985: 667-673
13		Vinod K. Agarwal, Janusz Rajski: Testing Properties and Applications of Inverter-Free PLA's. ITC 1985: 500-507
12		Arun K. Somani, Vinod K. Agarwal: An Efficient Unsorted VLSI Dictionary Machine. IEEE Trans. Computers 34(9): 841-852 (1985)
	1984
11		Arun K. Somani, Vinod K. Agarwal: An Efficient VLSI Dictionary Machine. ISCA 1984: 142-150
10		Yervant Zorian, Vinod K. Agarwal: Higher Certainty of Error Coverage by Output Data Modification. ITC 1984: 140-147
9		Yvon Savaria, Vinod K. Agarwal, Nicholas C. Rumin, Jeremiah F. Hayes: A Design for Machines with Built-In Tolerance to Soft Errors. ITC 1984: 649-659
8		Jacek Jachner, Vinod K. Agarwal: Data Flow Anomaly Detection. IEEE Trans. Software Eng. 10(4): 432-437 (1984)
	1983
7		Michael G. Lamoureux, Vinod K. Agarwal: Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis. ITC 1983: 129-137
	1981
6		Vinod K. Agarwal, Andy S. F. Fung: Multiple Fault Testing of Large Circuits by Single Fault Test Sets. IEEE Trans. Computers 30(11): 855-865 (1981)
	1980
5		Vinod K. Agarwal, Gerald M. Masson: Generic Fault Characterizations for Table Look-Up Coverage Bounding. IEEE Trans. Computers 29(4): 288-299 (1980)
4		Vinod K. Agarwal: Multiple Fault Detection in Programmable Logic Arrays. IEEE Trans. Computers 29(6): 518-522 (1980)
	1979
3		Vinod K. Agarwal, Gerald M. Masson: A Functional Form Approach to Test Set Coverage in Tree Networks. IEEE Trans. Computers 28(1): 50-52 (1979)
2		Vinod K. Agarwal, Gerald M. Masson: Recursive Coverage Projection of Test Sets. IEEE Trans. Computers 28(11): 865-870 (1979)
	1977
1		Vinod K. Agarwal, Gerald M. Masson: Resolution-Oriented Fault Interrelationships in Combinational Logic Networks. IEEE Trans. Computers 26(11): 1170-1175 (1977)

Coauthor Index

1	Robert C. Aitken (Rob Aitken)	[28] [34]
2	Erik R. Altman	[43] [48]
3	David Avis	[18] [25]
4	P. C. P. Bhatt	[49] [54]
5	Abhijit Chatterjee	[55]
6	Henry Cox	[22]
7	Wilfried Daehn	[31]
8	Michel Dagenais	[14] [15]
9	Anindya Das	[26] [38] [39] [44] [57] [61]
10	Hideo Fujiwara	[19]
11	Andy S. F. Fung	[6]
12	Guang R. Gao	[36] [41] [43] [46] [48]
13	Ramaswamy Govindarajan	[36] [41] [46]
14	Matthias Gruetzner	[31]
15	A. S. Mahmudul Hassan	[16]
16	Abu S. M. Hassan	[23] [27] [33]
17	Jeremiah F. Hayes	[9]
18	Michael C. Howells	[21]
19	Kaiyuan Huang	[37] [45] [52] [57] [58] [61]
20	Joseph L. A. Hughes	[55]
21	André Ivanov	[17] [20] [22] [24] [28] [31] [32] [34] [50] [51]
22	Jacek Jachner	[8]
23	Laurence E. LaForge	[37] [45] [52]
24	K. B. Lakshmanan (Kadathur B. Lakshmanan)	[26] [38] [39]
25	D. Lambidonis	[32] [50] [51]
26	Michael G. Lamoureux	[7]
27	Guoning Liao	[48]
28	Morie E. Malowany	[47]
29	Gerald M. Masson	[1] [2] [3] [5]
30	Benoit Nadeau-Dostie	[27] [30] [33]
31	Shashank S. Nemawarkar	[36] [41] [46]
32	Janusz Rajski	[13] [22] [23] [27] [33]
33	Gordon W. Roberts	[47]
34	Nicholas C. Rumin	[9] [14] [15]
35	Koppolu Sasidhar	[55]
36	Yvon Savaria	[9]
37	Allan Silburt	[30]
38	Arun K. Somani	[11] [12] [18] [25] [35]
39	Corot W. Starke	[31]
40	Oryal Tanir	[49] [54]
41	Krishnaiyan Thulasiraman	[26] [38] [39] [44] [52] [57] [58] [61]
42	Robert P. Treuer	[19] [40] [42]
43	Tom W. Williams	[31]
44	Dhiren Xavier	[28] [34] [50]
45	Yervant Zorian	[10] [29]

Colors in the list of coauthors