Frank Agricola

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1993

1 Samir Naik, Frank Agricola, Wojciech Maly: Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. IEEE Design & Test of Computers 10(2): 13-23 (1993)

	1993
1		Samir Naik, Frank Agricola, Wojciech Maly: Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. IEEE Design & Test of Computers 10(2): 13-23 (1993)

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