G. Aichmayr
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2003
1
G. Aichmayr: Correlation of gate oxide reliability and product tests on leading edge DRAM technology.
Microelectronics Reliability 43
(9-11): 1389-1393 (2003)
Copyright ©
Wed Dec 9 16:00:12 2009 by
Michael Ley
(
ley@uni-trier.de
)