Akira Aikawa

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2006

1 Keiichi Horio, Akira Aikawa, Takeshi Yamakawa: Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map. ICICIC (2) 2006: 293-296

	2006
1		Keiichi Horio, Akira Aikawa, Takeshi Yamakawa: Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map. ICICIC (2) 2006: 293-296

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