Robert C. Aitken

Rob Aitken

	2009
64		Shidhartha Das, David Blaauw, David Bull, Krisztián Flautner, Rob Aitken: Addressing design margins through error-tolerant circuits. DAC 2009: 11-12
63		Vikas Chandra, Robert C. Aitken: Impact of voltage scaling on nanoscale SRAM reliability. DATE 2009: 387-392
62		Robert C. Aitken: The challenges of correlating silicon and models in high variability CMOS processes. ISPD 2009: 181-182
61		Robert C. Aitken: DFX and Productivity. VLSI Design 2009: 8
	2008
60		Juan C. Rey, N. S. Nagaraj, Andrew B. Kahng, Fabian Klass, Rob Aitken, Cliff Hou, Luigi Capodieci, Vivek Singh: DFM in practice: hit or hype? DAC 2008: 898-899
59		S. Turnoy, Peter Wintermayr, Robert C. Aitken, Rudy Lauwereins, J. Tracy Weed, V. Kiefer, J. Hartmann: Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. DATE 2008: 510
58		Vikas Chandra, Robert C. Aitken: Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. DFT 2008: 114-122
57		Rob Aitken, Jerry Bautista, Wojciech Maly, Jan M. Rabaey: More Moore: foolish, feasible, or fundamentally different? ICCAD 2008: 9
56		Rob Aitken, Erik Jan Marinissen: Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis. IEEE Design & Test of Computers 25(3): 206-207 (2008)
	2007
55		Robert C. Aitken, Sachin Idgunji: Worst-case design and margin for embedded SRAM. DATE 2007: 1289-1294
54		Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki: DFM/DFY: should you trust the surgeon or the family doctor? DATE 2007: 439-442
53		Robert C. Aitken: Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. ISQED 2007: 693-698
52		Dimitris Gizopoulos, Robert C. Aitken, S. Kundu: Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". IEEE Trans. VLSI Syst. 15(5): 493-494 (2007)
	2006
51		Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon: Low-power design tools: are EDA vendors taking this matter seriously? DATE 2006: 1227
50		Robert C. Aitken: Reliability Issues for Embedded SRAM at 90nm and Below. IOLTS 2006: 75
49		Robert C. Aitken: DFM Metrics for Standard Cells. ISQED 2006: 491-496
	2005
48		Robert C. Aitken, Betina Hold: Modeling Soft-Error Susceptibility for IP Blocks. IOLTS 2005: 70-73
47		Robert C. Aitken: ITC is Cool. IEEE Design & Test of Computers 22(6): 616 (2005)
	2004
46		Robert C. Aitken, Fidel Muradali: From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE 2004: 2
45		Robert C. Aitken: A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. ITC 2004: 997-1005
44		Robert C. Aitken: Redundancy & It's Not Just for Defects Anymore. MTDT 2004: 117-120
43		Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker: ITC 2003 Roundtable: Design for Manufacturability. IEEE Design & Test of Computers 21(2): 144-156 (2004)
42		Carol Stolicny, Tapio Koivukangas, Rubin A. Parekhji, Ian G. Harris, Rob Aitken: ITC 2003 panels: Part 1. IEEE Design & Test of Computers 21(2): 160-163 (2004)
41		Rob Aitken: Test at Gbps: Megaproblem or micromanagement? IEEE Design & Test of Computers 21(4): 344- (2004)
	2003
40		Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker: Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator. DFT 2003: 467-474
39		Robert C. Aitken: DFM: The Real 90nm Hurdle. ITC 2003: 1313
38		Robert C. Aitken: Silicon IP And Successful DFM. ITC 2003: 1314
37		Robert C. Aitken: Applying Defect-Based Test to Embedded Memories in a COT Model. MTDT 2003: 72-
36		Robert C. Aitken, Gordon W. Roberts: ITC 2003: Breaking Test Interface Bottlenecks. IEEE Design & Test of Computers 20(5): 54- (2003)
35		Gordon W. Roberts, Robert C. Aitken: ITC Highlights. IEEE Design & Test of Computers 20(5): 55-57 (2003)
	2002
34		Robert C. Aitken: Test Generation and Fault Modeling for Stress Testing (invited). ISQED 2002: 95-99
33		Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin: Wireless Test. VTS 2002: 173-174
32		Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up. VTS 2002: 177-180
31		Robert C. Aitken, Donald L. Wheater: Guest Editors' Introduction: Stressing the Fundamentals. IEEE Design & Test of Computers 19(5): 54-55 (2002)
	2000
30		Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production IDDQ testing. ITC 2000: 1148-1156
	1999
29		Robert C. Aitken: It Makes Sense to Combine DFT and DFR/DFY. ITC 1999: 1143
28		Robert C. Aitken, Fidel Muradali: Trends in SLI design and their effect on test. ITC 1999: 628-637
27		Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production I_DDQ testing. ITC 1999: 738-746
26		Robert C. Aitken: Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. VTS 1999: 128-134
25		Robert C. Aitken: Nanometer Technology Effects on Fault Models for IC Testing. IEEE Computer 32(11): 46-51 (1999)
	1998
24		Robert C. Aitken, Jason Cong, Randy Harr, Kenneth L. Shepard, Wayne Wolf: How will CAD handle billion-transistor systems? (panel). ICCAD 1998: 5
23		Robert C. Aitken: On-chip versus off-chip test: an artificial dichotomy. ITC 1998: 1146
	1997
22		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
21		Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian: Power Dissipation During Testing: Should We Worry About it? VTS 1997: 456-457
20		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
19		Robert C. Aitken: Modeling the Unmodelable: Algorithmic Fault Diagnosis. IEEE Design & Test of Computers 14(3): 98-103 (1997)
	1996
18		Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown: IDDQ and AC Scan: The War Against Unmodelled Defects. ITC 1996: 250-258
17		Robert C. Aitken: Modelling the Unmodellable: Algorithmic Fault Diagnosis. ITC 1996: 931
16		Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck: Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS 1996: 212-213
15		Robert C. Aitken: When tools cry wolf: Testability pitfalls of synthesized designs. IEEE Design & Test of Computers 13(4): 96- (1996)
	1995
14		Robert C. Aitken: Finding Defects with Fault Models. ITC 1995: 498-505
13		Robert C. Aitken: An Overview of Test Synthesis Tools. IEEE Design & Test of Computers 12(2): 8-15 (1995)
	1994
12		Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman: The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC 1994: 739-746
	1993
11		Robert C. Aitken: BP-1992 A Comparison of Defect Models for Fault Location with IDDQ Measurements. ITC 1993: 1051-1060
10		Peter C. Maxwell, Robert C. Aitken: Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC 1993: 63-72
9		Peter C. Maxwell, Robert C. Aitken: Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Design & Test of Computers 10(1): 42-51 (1993)
	1992
8		Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang: The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC 1992: 168-177
7		Robert C. Aitken: A Comparison of Defect Models for Fault Location with IDDQ Measurements. ITC 1992: 778-787
6		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 16-25 (1992)
5		Peter C. Maxwell, Robert C. Aitken: IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electronic Testing 3(4): 305-316 (1992)
4		Robert C. Aitken: Diagnosis of leakage faults with IDDQ. J. Electronic Testing 3(4): 367-375 (1992)
	1991
3		Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang: The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC 1991: 358-364
2		Robert C. Aitken: Fault Location with Current Monitoring. ITC 1991: 623-632
	1989
1		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: : Experiments on Aliasing in Signature Analysis Registers. ITC 1989: 344-354

Coauthor Index

1	Vinod K. Agarwal	[1] [6]
2	Vishwani D. Agrawal	[21]
3	Jerry Bautista	[57]
4	Scott Becker	[40]
5	David Blaauw (David T. Blaauw)	[64]
6	J. Braden	[21]
7	Allen C. Brown	[18]
8	David Bull	[64]
9	Kenneth M. Butler	[20] [22]
10	Luigi Capodieci	[60]
11	Marco Casale-Rossi	[54]
12	Vikas Chandra	[58] [63]
13	Inshen Chiang	[3] [8]
14	Sanghoon Choi	[33]
15	Jason Cong	[24]
16	Shidhartha Das	[64]
17	H. Ding	[33]
18	Neeraj Dogra	[40]
19	Antun Domic	[51] [54]
20	Ronald Dudley	[27] [30]
21	S. Eichenberge	[32]
22	Stefan Eichenberger	[43]
23	William R. Eisenstadt	[33]
24	Joan Figueras	[21]
25	Krisztián Flautner	[64]
26	Dirk Friebel	[51]
27	Dhrumil Gandhi	[40]
28	A. Gattike	[32]
29	Dimitris Gizopoulos	[52]
30	Carlo Guardiani	[54]
31	Randy Harr	[24]
32	Ian G. Harris	[42]
33	J. Hartmann	[59]
34	Betina Hold	[48]
35	Cliff Hou	[60]
36	Leendert M. Huisman	[12]
37	J. Hutcheson	[16]
38	Sachin Idgunji	[55]
39	André Ivanov	[1] [6]
40	Neal Jaarsma	[27] [30]
41	Vic Johansen	[3] [8]
42	Andrew B. Kahng	[60]
43	V. Kiefer	[59]
44	Fabian Klass	[60]
45	Tapio Koivukangas	[42]
46	Kathleen R. Kollitz	[18]
47	S. Kumar	[21]
48	S. Kundu	[52]
49	Sandip Kundu	[43]
50	Rudy Lauwereins	[59]
51	Enrico Macii	[51]
52	Philippe Magarshack	[54]
53	Gary Maier	[43]
54	Wojciech Maly	[22] [57]
55	Erik Jan Marinissen	[56]
56	Peter C. Maxwell	[3] [5] [8] [9] [10] [12] [18] [20] [22] [27] [30]
57	John McLaughlin	[33]
58	M. Millegen	[32]
59	Fidel Muradali	[28] [46]
60	N. Murthy	[16]
61	N. S. Nagaraj	[60]
62	Wayne M. Needham	[20] [22]
63	Phil Nigh	[16] [20] [22]
64	Pete O'Neill	[27] [30]
65	Rubin A. Parekhji	[42]
66	Douglas Pattullo	[54]
67	Massoud Pedram	[51]
68	Minh Quach	[27] [30]
69	Jan M. Rabaey	[57]
70	Juan C. Rey	[60]
71	Gordon W. Roberts	[35] [36]
72	Joseph Sawicki	[54]
73	Julie Segal	[32]
74	R. Seger	[32]
75	Rene Segers	[32]
76	Kenneth L. Shepard	[24]
77	Vivek Singh	[60]
78	Mustapha Slamani	[33]
79	Nicholas Sporck	[16]
80	Carol Stolicny	[42]
81	Andrzej J. Strojwas	[54]
82	S. Turnoy	[59]
83	S. Venkataraman	[32]
84	Hank Walker	[43]
85	J. Tracy Weed	[59]
86	Donald L. Wheater	[31]
87	Peter Wintermayr	[59]
88	Don Wiseman	[27] [30]
89	Wayne Wolf	[24]
90	Hans-Joachim Wunderlich	[21]
91	Dhiren Xavier	[1] [6]
92	Roberto Zafalon	[51]
93	Yervant Zorian	[21]

Colors in the list of coauthors