Armagan Akar

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2002

1 Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek: Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. Asian Test Symposium 2002: 311-316

	2002
1		Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek: Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. Asian Test Symposium 2002: 311-316

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