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 | 2005 | |
|---|---|---|
| 1 |      | Takeo Matsuki, Kazuyoshi Torii, Takeshi Maeda, Yasushi Akasaka, Kiyoshi Hayashi, Naoki Kasai, Tsunetoshi Arikado: Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. IEICE Transactions 88-C(5): 804-810 (2005) |
| 1 | Tsunetoshi Arikado | [1] |
| 2 | Kiyoshi Hayashi | [1] |
| 3 | Naoki Kasai | [1] |
| 4 | Takeshi Maeda | [1] |
| 5 | Takeo Matsuki | [1] |
| 6 | Kazuyoshi Torii | [1] |