Selim Sermet Akbay

	2007
4		Selim Sermet Akbay, Abhijit Chatterjee: Fault-based alternate test of RF components. ICCD 2007: 518-525
	2005
3		Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111
2		Selim Sermet Akbay, Abhijit Chatterjee: Built-In Test of RF Components Using Mapped Feature Extraction Sensors. VTS 2005: 243-248
	2004
1		Selim Sermet Akbay, Abhijit Chatterjee: Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. VTS 2004: 273-290

Coauthor Index

1	Soumendu Bhattacharya	[3]
2	Abhijit Chatterjee	[1] [2] [3] [4]
3	William R. Eisenstadt	[3]
4	Donghoon Han	[3]