 | 1992 |
|---|
| 12 |       | Sungju Park,
Sheldon B. Akers:
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination.
ITC 1992: 303-311 |
| 11 |  | Sungju Park,
Sheldon B. Akers:
Parity bit calculation and test signal compaction for BIST applications.
J. Electronic Testing 3(1): 45-52 (1992) |
| 1991 |
|---|
| 10 | | Sungju Park,
Sheldon B. Akers:
Parity Bit Calculation and Test Signal Compaction for BIST Applications.
ITC 1991: 1016-1023 |
| 1989 |
|---|
| 9 | | Sheldon B. Akers,
Winston Jansz:
Test Set Embedding in a Built-In Self-Test Environment.
ITC 1989: 257-263 |
| 8 | | Sheldon B. Akers,
Balakrishnan Krishnamurthy:
A Group-Theoretic Model for Symmetric Interconnection Networks.
IEEE Trans. Computers 38(4): 555-566 (1989) |
| 1988 |
|---|
| 7 | | Sheldon B. Akers:
A parity bit signature for exhaustive testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(3): 333-338 (1988) |
| 1987 |
|---|
| 6 | | Sheldon B. Akers,
Balakrishnan Krishnamurthy,
Dov Harel:
The Star Graph: An Attractive Alternative to the n-Cube.
ICPP 1987: 393-400 |
| 5 | | Sheldon B. Akers,
Balakrishnan Krishnamurthy:
On Group Graphs and Their Fault Tolerance.
IEEE Trans. Computers 36(7): 885-888 (1987) |
| 1986 |
|---|
| 4 | | Sheldon B. Akers,
Balakrishnan Krishnamurthy:
: A Group Theoretic Model for Symmetric Interconnection Networks.
ICPP 1986: 216-223 |
| 3 | | Sheldon B. Akers:
A Parity Bit Signature for Exhaustive Testing.
ITC 1986: 48-53 |
| 1984 |
|---|
| 2 | | Balakrishnan Krishnamurthy,
Sheldon B. Akers:
On the Complexity of Estimating the Size of a Test Set.
IEEE Trans. Computers 33(8): 750-753 (1984) |
| 1978 |
|---|
| 1 | | Sheldon B. Akers:
Binary Decision Diagrams.
IEEE Trans. Computers 27(6): 509-516 (1978) |
