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 | 1999 | |
|---|---|---|
| 1 |      | Mostafa H. Abd-El-Barr, Maher Al-Sherif, Mohamed Osman: Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits. ISMVL 1999: 262-267 |
| 1 | Mostafa H. Abd-El-Barr | [1] |
| 2 | Mohamed Osman | [1] |