Ali Al-Suwaiyan

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2002

1 Aiman El-Maleh, Ali Al-Suwaiyan: An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. VTS 2002: 53-59

	2002
1		Aiman El-Maleh, Ali Al-Suwaiyan: An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. VTS 2002: 53-59

Coauthor Index

1 Aiman H. El-Maleh (Aiman El-Maleh) [1]