M. A. Alam

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2005

1 M. A. Alam, S. Mahapatra: A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability 45(1): 71-81 (2005)

	2005
1		M. A. Alam, S. Mahapatra: A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability 45(1): 71-81 (2005)

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