Muhammad A. Alam

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2005

1 Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. Alam: Gate dielectric breakdown in the time-scale of ESD events. Microelectronics Reliability 45(3-4): 427-436 (2005)

	2005
1		Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. Alam: Gate dielectric breakdown in the time-scale of ESD events. Microelectronics Reliability 45(3-4): 427-436 (2005)

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