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DBLP keys2006
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNoohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod: Dynamic Voltage Scaling Aware Delay Fault Testing. European Test Symposium 2006: 15-20

Coauthor Index

1Bashir M. Al-Hashimi [1]
2Peter Harrod [1]
3Mark Zwolinski [1]

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