 | 2007 |
|---|
| 11 |       | D. Mateo,
Josep Altet,
E. Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectronics Journal 38(2): 151-156 (2007) |
| 2006 |
|---|
| 10 | | Josep Altet,
D. Mateo,
J. L. González,
E. Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
ISCAS 2006 |
| 2004 |
|---|
| 9 | | Josep Altet,
Antonio Rubio,
M. Amine Salhi,
J. L. Gálvez,
Stefan Dilhaire,
Ashish Syal,
André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing.
VTS 2004: 179-184 |
| 8 | | Josep Altet,
J. M. Rampnoux,
Jean-Christophe Batsale,
Stefan Dilhaire,
Antonio Rubio,
Wilfrid Claeys,
Stéphane Grauby:
Applications of temperature phase measurements to IC testing.
Microelectronics Reliability 44(1): 95-103 (2004) |
| 2003 |
|---|
| 7 | | Josep Altet,
André Ivanov,
A. Wong:
Thermal Testing of Analogue Integrated Circuits: A Case Study.
J. Electronic Testing 19(3): 353-357 (2003) |
| 2002 |
|---|
| 6 | | Ashish Syal,
Victor Lee,
André Ivanov,
Josep Altet:
CMOS Differential and Absolute Thermal Sensors.
J. Electronic Testing 18(3): 295-304 (2002) |
| 2001 |
|---|
| 5 | | Ashish Syal,
Victor Lee,
André Ivanov,
Josep Altet:
CMOS Differential and Absolute Thermal Sensors.
IOLTW 2001: 127- |
| 2000 |
|---|
| 4 | | Josep Altet,
Antonio Rubio,
E. Schaub,
Stefan Dilhaire,
Wilfrid Claeys:
Thermal Testing: Fault Location Strategies.
VTS 2000: 189-194 |
| 1999 |
|---|
| 3 | | Josep Altet,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire,
E. Schaub,
Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility.
J. Electronic Testing 14(1-2): 57-66 (1999) |
| 1997 |
|---|
| 2 | | Josep Altet,
Antonio Rubio,
Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium 1997: 149-154 |
| 1 | | Josep Altet,
Antonio Rubio:
Differential Sensing Strategy for Dynamic Thermal Testing of ICs.
VTS 1997: 434-439 |
