 | 2008 |
|---|
| 3 |       | Kenta Yamada,
Takashi Sato,
Shuhei Amakawa,
Noriaki Nakayama,
Kazuya Masu,
Shigetaka Kumashiro:
Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
IEICE Transactions 91-C(7): 1142-1150 (2008) |
| 2007 |
|---|
| 2 | | Takashi Sato,
Takumi Uezono,
Shiho Hagiwara,
Kenichi Okada,
Shuhei Amakawa,
Noriaki Nakayama,
Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED 2007: 21-26 |
| 1 | | Shuhei Amakawa,
Takumi Uezono,
Takashi Sato,
Kenichi Okada,
Kazuya Masu:
Adaptable wire-length distribution with tunable occupation probability.
SLIP 2007: 1-8 |
