I. Ames

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2000

1 I. Ames, F. M. d'Heurle, R. E. Horstmann: Reduction of electromigration in aluminium films by copper doping. IBM Journal of Research and Development 44(1): 89-92 (2000)

	2000
1		I. Ames, F. M. d'Heurle, R. E. Horstmann: Reduction of electromigration in aluminium films by copper doping. IBM Journal of Research and Development 44(1): 89-92 (2000)

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