Enamul Amyeen Coauthor index DBLP Vis pubzone.org

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DBLP keys2007
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
2006
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy: Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS 2006: 392-399
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRuifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71
2004
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEnamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee: Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLIrith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen: Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design 2004: 475-480
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSrikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30
2003
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz: Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS 2003: 351-358
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEnamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Fault equivalence identification in combinational circuits using implication and evaluation techniques. IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 922-936 (2003)
2002
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEnamul Amyeen, Irith Pomeranz, W. Kent Fuchs: Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. VTS 2002: 181-186
2001
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEnamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. VTS 2001: 124-130
1999
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEnamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Implication and Evaluation Techniques for Proving Fault Equivalence. VTS 1999: 201-213

Coauthor Index

1Vamsi Boppana [1] [2] [4]
2W. Kent Fuchs [1] [2] [3] [4]
3Ruifeng Guo [5] [6] [9] [11]
4Michael S. Hsiao [11]
5Jinkyu Lee [9]
6Sangbong Lee [6] [8]
7Subhasish Mitra [9]
8Ajay Ojha [6] [8]
9Irith Pomeranz [1] [2] [3] [4] [5] [7] [10]
10Sudhakar M. Reddy [7] [10]
11Bharath Seshadri [10]
12Srihari Sivaraj [6] [9]
13Srikanth Venkataraman [5] [6] [7] [8] [9] [10] [11]
14Vishnu C. Vimjam [11]
15Kai Yang [11]
16Xiaoming Yu [5]

Copyright © Mon Nov 30 15:58:31 2009 by Michael Ley (ley@uni-trier.de)