G. Antonin
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1991
1
G. Antonin,
H.-D. Oberle
,
Jochen Kolzer
: Electrical Characterization of Megabit DRAMs, Part 1: External Testing.
IEEE Design & Test of Computers 8
(3): 36-43 (1991)
Coauthor Index
1
Jochen Kolzer
[
1
]
2
H.-D. Oberle
[
1
]
Copyright ©
Sat Dec 19 20:34:11 2009 by
Michael Ley
(
ley@uni-trier.de
)