 | 2009 |
|---|
| 5 |       | Olivier Ginez,
Jean Michel Portal,
Hassen Aziza:
An on-line testing scheme for repairing purposes in Flash memories.
DDECS 2009: 120-123 |
| 2005 |
|---|
| 4 | | Jean Michel Portal,
Hassen Aziza,
Didier Née:
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement.
J. Electronic Testing 21(1): 33-42 (2005) |
| 2003 |
|---|
| 3 | | Jean Michel Portal,
Hassen Aziza,
Didier Née:
EEPROM Memory: Threshold Voltage Built In Self Diagnosis.
ITC 2003: 23-28 |
| 2002 |
|---|
| 2 | | Jean Michel Portal,
L. Forli,
Hassen Aziza,
Didier Née:
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell.
ITC 2002: 31-36 |
| 1 | | Jean Michel Portal,
L. Forli,
Hassen Aziza,
Didier Née:
An Automated Design Methodology for EEPROM Cell (ADE).
MTDT 2002: 137-142 |
